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Design of a Two-Stage Gas Amplification Secondary Electron Detector for Imaging Insulating Samples at the sub-1 nm Scale

  • W. Ralph Knowles (a1), B L Thiel (a2), Milos Toth (a1), R P M Schroemges (a1), J J Scholtz (a1), Gerard van Veen (a1), Marcel Elders (a1) and A M Donald (a3)...


Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.



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