Microscopy and Microanalysis: Volume 10 - Issue S02

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Volume 10 - Issue S02 - August 2004

Contents

Page 24 of 40

Quantitative X-ray Microanalysis

Research Article

Al and Si Kα: Peaks, Peaking and the Elusive 1% Accuracy in "Common" Minerals
John Fournelle
Published online by Cambridge University Press:

01 August 2004, pp. 908-909
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Rediscovering Ancient Technology: Microbeam Analysis of Han Purple
Eric Doehne, Qinglin Ma
Published online by Cambridge University Press:

01 August 2004, pp. 910-911
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

"Maximum Channel Spectrum": An Intuitive Software Tool for Detecting and Recovering Rare Features in Spectrum Image Datacubes
David Bright, Dale E Newbury
Published online by Cambridge University Press:

01 August 2004, pp. 912-913
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Spectral Imaging Opens a New Era in Quantitative X-Ray Mapping
Patrick Camus
Published online by Cambridge University Press:

01 August 2004, pp. 914-915
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

X-Ray Mapping and Electron Back-Scattered Diffraction of Phases in Welded Materials
Richard Wuhrer, Ken Moran, Paul Huggett, Matthew R Phillips, Besim Ben-Nissan
Published online by Cambridge University Press:

01 August 2004, pp. 916-917
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Low Voltage X-ray Microanalysis with a Microcalorimeter Detector
Edward A Kenik, Ian M Anderson, David C Joy, S T Lazarz, J A Norrell
Published online by Cambridge University Press:

01 August 2004, pp. 918-919
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

X-ray Microanalysis with PENELOPE
Xavier Llovet, JoséÈ María Fernández-Varea, Josep Sempau, Francesc Salvat
Published online by Cambridge University Press:

01 August 2004, pp. 920-921
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Monte Carlo Simulation of EDS X-Ray Spectra
Raynald Gauvin
Published online by Cambridge University Press:

01 August 2004, pp. 922-923
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Light Rejection Evaluation of Ultrathin Polymer EDS Windows
M C Roberts, Eric C Anderson
Published online by Cambridge University Press:

01 August 2004, pp. 924-925
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

A New NIST SRM® for Microanalysis and X-ray Fluorescence, TiAl(NbW) Alloy
Ryna B Marinenko, John R Sieber, Lee L Yu, Therese A Butler, Stefan Leigh
Published online by Cambridge University Press:

01 August 2004, pp. 926-927
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Development of Microanalytical Reference Materials for Geochemical Analysis
Stephen A Wilson, Phil A Potts
Published online by Cambridge University Press:

01 August 2004, pp. 928-929
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Accessorizing the SEM

Research Article

The Structural and Chemical Analyzer (SCA): A New Analytical Technique for SEM
Tim Prusnick, A. D. Brooker, Robert Bennett
Published online by Cambridge University Press:

01 August 2004, pp. 930-931
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

A Structural and Chemical Analyser (SCA) Identification of Bacteria Labelled by Metallic Nanoparticles
Alan Derek Brooker, R M Jarvis, Royston Goodacre, Robert Bennett, C J Dawe, D J Leak, M J Lainchbury, M R Hill
Published online by Cambridge University Press:

01 August 2004, pp. 932-933
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Random Probability Calculations in Texture Measurements
Cheng Tsien Chou
Published online by Cambridge University Press:

01 August 2004, pp. 934-935
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

EBSD - Current Achievements in Speed and Resolution
T M Maitland
Published online by Cambridge University Press:

01 August 2004, pp. 936-937
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

An Energy Filter for Electron Backscattering Diffraction
T K Hooghan, Philippe Staib, Alwyn Eades
Published online by Cambridge University Press:

01 August 2004, pp. 938-939
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Monte Carlo Simulation for Electron Backscattering Diffraction
Xiaodong Tao, Alwyn Eades
Published online by Cambridge University Press:

01 August 2004, pp. 940-941
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Properties and Applications of New Silicon Drift Detectors and Multiple Element Silicon Drift Detectors
Ralf Terborg, Martin Rohde
Published online by Cambridge University Press:

01 August 2004, pp. 942-943
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Spectrum Image Mapping with a Silicon Drift Detector (SDD) in an SEM
D E Newbury, J A Small, David Bright, Jan S Iwanczyk, Shaul Barkan, J F Thiot
Published online by Cambridge University Press:

01 August 2004, pp. 944-945
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Nanorobots for the SEM
Stephan Kleindiek
Published online by Cambridge University Press:

01 August 2004, pp. 946-947
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Page 24 of 40

Microscopy and Microanalysis

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Volume 10 - Issue S02 - August 2004

Quantitative X-ray Microanalysis

Research Article

Al and Si Kα: Peaks, Peaking and the Elusive 1% Accuracy in "Common" Minerals

Rediscovering Ancient Technology: Microbeam Analysis of Han Purple

"Maximum Channel Spectrum": An Intuitive Software Tool for Detecting and Recovering Rare Features in Spectrum Image Datacubes

Spectral Imaging Opens a New Era in Quantitative X-Ray Mapping

X-Ray Mapping and Electron Back-Scattered Diffraction of Phases in Welded Materials

Low Voltage X-ray Microanalysis with a Microcalorimeter Detector

X-ray Microanalysis with PENELOPE

Monte Carlo Simulation of EDS X-Ray Spectra

Light Rejection Evaluation of Ultrathin Polymer EDS Windows

A New NIST SRM® for Microanalysis and X-ray Fluorescence, TiAl(NbW) Alloy

Development of Microanalytical Reference Materials for Geochemical Analysis

Accessorizing the SEM

Research Article

The Structural and Chemical Analyzer (SCA): A New Analytical Technique for SEM

A Structural and Chemical Analyser (SCA) Identification of Bacteria Labelled by Metallic Nanoparticles

Random Probability Calculations in Texture Measurements

EBSD - Current Achievements in Speed and Resolution

An Energy Filter for Electron Backscattering Diffraction

Monte Carlo Simulation for Electron Backscattering Diffraction

Properties and Applications of New Silicon Drift Detectors and Multiple Element Silicon Drift Detectors

Spectrum Image Mapping with a Silicon Drift Detector (SDD) in an SEM

Nanorobots for the SEM

Microscopy and Microanalysis

Refine listing

Actions for selected content:

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Volume 10 - Issue S02 - August 2004

Quantitative X-ray Microanalysis

Research Article

Accessorizing the SEM

Research Article