Microscopy and Microanalysis: Volume 10 - Issue S02

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Volume 10 - Issue S02 - August 2004

Contents

Page 26 of 40

Aberration Correction, Electron Holography, High-Resolution TEM

Research Article

Electron Beam Induced Charging of Focused Ion Beam Milled Semiconductor Transistors Examined Using Electron Holography
Takeshi Kasama, Rafal E Dunin-Borkowski, Simon B Newcomb, Martha R McCartney
Published online by Cambridge University Press:

01 August 2004, pp. 988-989
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Interference of Elastically and Inelastically Scattered Electrons by DBI/H
Rodney A Herring
Published online by Cambridge University Press:

01 August 2004, pp. 990-991
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

HRTEM Study of a New Non-Stoichiometric BaTiO(3-δ) Structure
G. Y. Yang, E. C. Dickey, C. A. Randall, D. I. Woodward, I. M. Reaney
Published online by Cambridge University Press:

01 August 2004, pp. 992-993
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Observation of Point Defect in Silicon using HRTEM
Sung Il Baik, Hee-Suk Chung, Jian-Min Zuo, Young-Woon Kim
Published online by Cambridge University Press:

01 August 2004, pp. 994-995
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Observation of Si Nanocrystals by Spherical-Aberration Corrected Transmission Electron Microscopy
Christopher R Perrey, Julia M Deneen, Siri S Thompson, Markus Lentzen, Uwe Kortshagen, C. Barry Carter
Published online by Cambridge University Press:

01 August 2004, pp. 996-997
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Direct Imaging of the InSb(111)B-2x2 Surface by HR Profile-TEM Technique
T.D. Mishima, N. Naruse, T. Osaka
Published online by Cambridge University Press:

01 August 2004, pp. 998-999
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Web-Based Electron Microscopy Application Software: Web-EMAPS
J. M. Zuo, J. C. Mabon
Published online by Cambridge University Press:

01 August 2004, pp. 1000-1001
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

A Standard for Sub-Ångstrom Metrology of Resolution in Aberration-Corrected Transmission Electron Microscopes
Michael A. O'Keefe, Lawrence F. Allard
Published online by Cambridge University Press:

01 August 2004, pp. 1002-1003
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Cs Corrector for Illumination
Hidetaka Sawada, Takeshi Tomita, Mikio Naruse, Toshikazu Honda, Peter Hartel, Max Haider, Crispin J D Hetherington, Ron C Doole, Angus I Kirkland, John L Hutchison, John M Titchmarsh, David J H Cockayne
Published online by Cambridge University Press:

01 August 2004, pp. 1004-1005
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Possibility of Cs-Corrected High-Resolution Electron Microscopy of CTF of cosχ for Silicon Crystals
Nobuo Tanaka, Tomoykui Kawai, Jun Yamasaki
Published online by Cambridge University Press:

01 August 2004, pp. 1006-1007
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Confocal Electron Holography
Rodney A Herring
Published online by Cambridge University Press:

01 August 2004, pp. 1008-1009
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

The Prospect of Three-Dimensional Induction Mapping Inside Magnetic Nanostructures by Combining Electron Holography with Electron Tomography
Rafal E Dunin-Borkowski, Takeshi Kasama
Published online by Cambridge University Press:

01 August 2004, pp. 1010-1011
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

An Ultra-High-Tilt Two-Contact Electrical Biasing Specimen Holder for Electron Holography and Electron Tomography of Semiconductor Devices
Rafal E Dunin-Borkowski, Alison C Twitchett, Jonathan S Barnard, Ronald F Broom, Paul A Midgley, Alan C Robins, David W Smith, Jeff J Gronsky, Paul E Fischione
Published online by Cambridge University Press:

01 August 2004, pp. 1012-1013
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Micro X-ray Techniques: New Compositional and Structural Characterization Tools

Research Article

Quantitative X-ray Mapping and Spectrum Imaging
John J Friel
Published online by Cambridge University Press:

01 August 2004, pp. 1014-1015
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Cryo X-ray Tomography: New Tool for 3-D Imaging of Biological Specimens at better than 50 nm Resolution
Mark A Le Gros, Carolyn A Larabell
Published online by Cambridge University Press:

01 August 2004, pp. 1016-1017
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Scanning Transmission X-ray Microscopes at the Advanced Light Source: Performance and Experimental Capabilities
Tolek Tyliszczak, A. L. David Kilcoyne, J. Alexander Liddle, Tony Warwick, Adam P. Hitchcock, Harald Ade, David K. Shuh
Published online by Cambridge University Press:

01 August 2004, pp. 1018-1019
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

X-ray Linear Dichroism Microscopy of Crystalline Short Chain Alkanes and Semi-crystalline Polyethylene Thin Films
Harald Ade, Ying Zou, A.D.L. Kilcoyne, Yantian Wang, Miriam Rafailovich, J. Sokolov
Published online by Cambridge University Press:

01 August 2004, pp. 1020-1021
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

The Polychromatic 3D X-ray Microscope: A New Tool for Materials Characterization
Gene E. Ice, Bennett C. Larson
Published online by Cambridge University Press:

01 August 2004, pp. 1022-1023
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

White Beam X-ray Microdiffraction Analysis of Polycrystalline Thin Films
G. S. Cargill
Published online by Cambridge University Press:

01 August 2004, pp. 1024-1025
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Spectrum Imaging and Automation for Comprehensive Specimen Surveys
Peter J Statham
Published online by Cambridge University Press:

01 August 2004, pp. 1026-1027
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Page 26 of 40

Microscopy and Microanalysis

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Volume 10 - Issue S02 - August 2004

Aberration Correction, Electron Holography, High-Resolution TEM

Research Article

Electron Beam Induced Charging of Focused Ion Beam Milled Semiconductor Transistors Examined Using Electron Holography

Interference of Elastically and Inelastically Scattered Electrons by DBI/H

HRTEM Study of a New Non-Stoichiometric BaTiO(3-δ) Structure

Observation of Point Defect in Silicon using HRTEM

Observation of Si Nanocrystals by Spherical-Aberration Corrected Transmission Electron Microscopy

Direct Imaging of the InSb(111)B-2x2 Surface by HR Profile-TEM Technique

Web-Based Electron Microscopy Application Software: Web-EMAPS

A Standard for Sub-Ångstrom Metrology of Resolution in Aberration-Corrected Transmission Electron Microscopes

Cs Corrector for Illumination

Possibility of Cs-Corrected High-Resolution Electron Microscopy of CTF of cosχ for Silicon Crystals

Confocal Electron Holography

The Prospect of Three-Dimensional Induction Mapping Inside Magnetic Nanostructures by Combining Electron Holography with Electron Tomography

An Ultra-High-Tilt Two-Contact Electrical Biasing Specimen Holder for Electron Holography and Electron Tomography of Semiconductor Devices

Micro X-ray Techniques: New Compositional and Structural Characterization Tools

Research Article

Quantitative X-ray Mapping and Spectrum Imaging

Cryo X-ray Tomography: New Tool for 3-D Imaging of Biological Specimens at better than 50 nm Resolution

Scanning Transmission X-ray Microscopes at the Advanced Light Source: Performance and Experimental Capabilities

X-ray Linear Dichroism Microscopy of Crystalline Short Chain Alkanes and Semi-crystalline Polyethylene Thin Films

The Polychromatic 3D X-ray Microscope: A New Tool for Materials Characterization

White Beam X-ray Microdiffraction Analysis of Polycrystalline Thin Films

Spectrum Imaging and Automation for Comprehensive Specimen Surveys

Microscopy and Microanalysis

Refine listing

Actions for selected content:

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Volume 10 - Issue S02 - August 2004

Aberration Correction, Electron Holography, High-Resolution TEM

Research Article

Micro X-ray Techniques: New Compositional and Structural Characterization Tools

Research Article