Hostname: page-component-848d4c4894-75dct Total loading time: 0 Render date: 2024-05-12T12:36:01.266Z Has data issue: false hasContentIssue false
  • English
  • Français

Scanning Transmission X-ray Microscopes at the Advanced Light Source: Performance and Experimental Capabilities

Published online by Cambridge University Press:  01 August 2004

Tolek Tyliszczak ,
A. L. David Kilcoyne ,
J. Alexander Liddle ,
Tony Warwick ,
Adam P. Hitchcock ,
Harald Ade  and
David K. Shuh
Tolek Tyliszczak
Affiliation:
Lawrence Berkeley National Laboratory, California
A. L. David Kilcoyne
Affiliation:
Lawrence Berkeley National Laboratory, California
J. Alexander Liddle
Affiliation:
Lawrence Berkeley National Laboratory, California
Tony Warwick
Affiliation:
Lawrence Berkeley National Laboratory, California
Adam P. Hitchcock
Affiliation:
McMaster University,Canada
Harald Ade
Affiliation:
North Carolina State University
David K. Shuh
Affiliation:
Lawrence Berkeley National Laboratory, California
Get access

Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 10 , Issue S02 , August 2004 , pp. 1018 - 1019
Copyright
© 2004 Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)