Microscopy and Microanalysis: Volume 10 - Issue S02

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Volume 10 - Issue S02 - August 2004

Contents

Page 21 of 40

Order in Disorder: Probing the Structure of Amorphous Materials

Research Article

Medium-Range Order in High Al-content Amorphous Alloys Measured by Fluctuation Electron Microscopy
W. G. Stratton, P. M. Voyles, J. Hamann, J. H. Perepezko
Published online by Cambridge University Press:

01 August 2004, pp. 788-789
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Analysis of Nano-Scale Phase Separation in a Pd40Ni40P20 Bulk Metallic Glass Deformed in the Supercooled Liquid Region by HREM and Nano-Diffraction
Jin Guo Wang, T. G. Nieh
Published online by Cambridge University Press:

01 August 2004, pp. 790-791
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Polyamorphism and the Anomalous Thermo-Mechanical Properties of Network Glasses
Liping Huang, John Kieffer
Published online by Cambridge University Press:

01 August 2004, pp. 792-793
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Spatially Resolved EELS-an Alternative Approach for Characterizing Glass Structure
Nan Jiang
Published online by Cambridge University Press:

01 August 2004, pp. 794-795
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Analytical TEM Studies of Borosilicate Glasses
Guenter Möbus, Rick Short, Russell J Hand
Published online by Cambridge University Press:

01 August 2004, pp. 796-797
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Fluctuation Microscopy Studies of Medium-range Order Structures of Near Frictionless Carbon Films
Xidong Chen, Jacqueline Johnson, Jon Hiller, Zhongyi Liu
Published online by Cambridge University Press:

01 August 2004, pp. 798-799
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Dark Field Microscopy for Diffraction Analysis of Non Crystalline Materials
David R McKenzie, Dougal G McCulloch, William E McBride
Published online by Cambridge University Press:

01 August 2004, pp. 800-801
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Hydrogen-Induced Reduction in Medium Range Order of a-Si Thin Films Observed using Fluctuation Electron Microscopy
Lakshmi Narayana Nittala, Sreenivas Jayaraman, Brent A Sperling, John R Abelson
Published online by Cambridge University Press:

01 August 2004, pp. 802-803
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Constrained Monte Carlo Approach to Modeling Disordered Materials
Parthapratim Biswas, Raymond Atta-Fynn, David A Drabold
Published online by Cambridge University Press:

01 August 2004, pp. 804-805
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Fluctuation Microscopy with Electrons or X-Rays: Insight into Medium-Range Order
J. M. Gibson, M.M.J. Treacy, L. Fan, I. McNulty, D. Paterson
Published online by Cambridge University Press:

01 August 2004, pp. 806-807
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

An Empirical Approach of Measuring RDF from Electron Diffraction Patterns.
xidong Chen
Published online by Cambridge University Press:

01 August 2004, pp. 808-809
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Understanding Fluctuation Microscopy - A Statistical Theory
xidong Chen
Published online by Cambridge University Press:

01 August 2004, pp. 810-811
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Fluctuation Microscopy Studies of Aluminum Oxides Exposed to Different Electrolytes
xidong Chen, John Sullivan, Charles Barbour, Craig Johnson
Published online by Cambridge University Press:

01 August 2004, pp. 812-813
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Medium-Range Ordering in Amorphous Diamond-like Carbon Films after Thermal Annealing
Xidong Chen, John Sullivan, Tom Friedmann, J. Murray Gibson
Published online by Cambridge University Press:

01 August 2004, pp. 814-815
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

In-Situ STEM Observation of Phase Separation in Ultrathin Ag/Cu Alloy System
Hao Chen, J. M. Zuo
Published online by Cambridge University Press:

01 August 2004, pp. 816-817
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Study of Medium-range Order in Amorphous Carbon by Efficient ab-initio Tight-Binding Technique
K. Kohary, D. Nguyen-Manh, D.J.H. Cockayne, N. Marks, D.G. Pettifor
Published online by Cambridge University Press:

01 August 2004, pp. 818-819
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Evidence from Simulations for Orientational Medium Range Order in Fluctuation-Electron-Microscopy Observations of a-Si
Sanjay V. Khare, Serge M. Nakhmanson, Paul M. Voyles, Pawel Keblinski, John R. Abelson
Published online by Cambridge University Press:

01 August 2004, pp. 820-821
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Electron Energy-Loss and X-ray Absorption Spectroscopies: Focus on Anisotropic Properties

Research Article

Magic Orientation, Magic Angle and Linear Dichroic Spectroscopy of Anisotropic Systems
Jun Yuan, Yukui K Sun, Shangpeng P Gao
Published online by Cambridge University Press:

01 August 2004, pp. 822-823
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Trace Element Chemistry in Spent Nuclear Fuel Using X-ray Absorption Spectroscopy
Jeffrey A. Fortner, A. Jeremy Kropf, Robert J. Finch, James C. Cunnane
Published online by Cambridge University Press:

01 August 2004, pp. 824-825
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Elastic Anomaly for SrTiO3 Thin Films Grown on Si(001)
J.C. Woicik, F.S. Aguirre-Tostado, A. Herrera-Gomez, R. Droopad, Z. Yu, D.G. Schlom, P. Zschack, E. Karapetrova, C.S. Hellberg
Published online by Cambridge University Press:

01 August 2004, pp. 826-827
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Page 21 of 40

Microscopy and Microanalysis

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Volume 10 - Issue S02 - August 2004

Order in Disorder: Probing the Structure of Amorphous Materials

Research Article

Medium-Range Order in High Al-content Amorphous Alloys Measured by Fluctuation Electron Microscopy

Analysis of Nano-Scale Phase Separation in a Pd40Ni40P20 Bulk Metallic Glass Deformed in the Supercooled Liquid Region by HREM and Nano-Diffraction

Polyamorphism and the Anomalous Thermo-Mechanical Properties of Network Glasses

Spatially Resolved EELS-an Alternative Approach for Characterizing Glass Structure

Analytical TEM Studies of Borosilicate Glasses

Fluctuation Microscopy Studies of Medium-range Order Structures of Near Frictionless Carbon Films

Dark Field Microscopy for Diffraction Analysis of Non Crystalline Materials

Hydrogen-Induced Reduction in Medium Range Order of a-Si Thin Films Observed using Fluctuation Electron Microscopy

Constrained Monte Carlo Approach to Modeling Disordered Materials

Fluctuation Microscopy with Electrons or X-Rays: Insight into Medium-Range Order

An Empirical Approach of Measuring RDF from Electron Diffraction Patterns.

Understanding Fluctuation Microscopy - A Statistical Theory

Fluctuation Microscopy Studies of Aluminum Oxides Exposed to Different Electrolytes

Medium-Range Ordering in Amorphous Diamond-like Carbon Films after Thermal Annealing

In-Situ STEM Observation of Phase Separation in Ultrathin Ag/Cu Alloy System

Study of Medium-range Order in Amorphous Carbon by Efficient ab-initio Tight-Binding Technique

Evidence from Simulations for Orientational Medium Range Order in Fluctuation-Electron-Microscopy Observations of a-Si

Electron Energy-Loss and X-ray Absorption Spectroscopies: Focus on Anisotropic Properties

Research Article

Magic Orientation, Magic Angle and Linear Dichroic Spectroscopy of Anisotropic Systems

Trace Element Chemistry in Spent Nuclear Fuel Using X-ray Absorption Spectroscopy

Elastic Anomaly for SrTiO3 Thin Films Grown on Si(001)

Microscopy and Microanalysis

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Volume 10 - Issue S02 - August 2004

Order in Disorder: Probing the Structure of Amorphous Materials

Research Article

Electron Energy-Loss and X-ray Absorption Spectroscopies: Focus on Anisotropic Properties

Research Article