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Silicon Drift Detectors for Fast and High Resolution Element Detection in Micro-Beam Analysis

Published online by Cambridge University Press:  01 August 2004

Heike Soltau ,
Peter Lechner ,
Gerhard Lutz ,
Lothar Strüder ,
Carlo Fiorini ,
Antonio Longoni ,
Rouven Eckhard ,
Andreas Pahlke ,
Martina Schnecke  and
Gerhard Schaller
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Heike Soltau
Affiliation:
PNSensor GmbH, Germany
Peter Lechner
Affiliation:
PNSensor GmbH, Germany
Gerhard Lutz
Affiliation:
MPI Halbleiterlabor, Germany
Lothar Strüder
Affiliation:
MPI Halbleiterlabor, Germany
Carlo Fiorini
Affiliation:
Politecnico di Milano, Italy
Antonio Longoni
Affiliation:
Politecnico di Milano, Italy
Rouven Eckhard
Affiliation:
PNSensor GmbH, Germany
Andreas Pahlke
Affiliation:
PNSensor GmbH, Germany
Martina Schnecke
Affiliation:
MPI Halbleiterlabor, Germany
Gerhard Schaller
Affiliation:
MPI Halbleiterlabor, Germany
Florian Schopper
Affiliation:
MPI Halbleiterlabor, Germany
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 10 , Issue S02 , August 2004 , pp. 1046 - 1047
Copyright
© 2004 Microscopy Society of America

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