Microscopy and Microanalysis: Volume 25 - Issue S2

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 25 - Supplement S2 - August 2019

Analytical and Instrumentation Science Symposia

Advances in Focused Ion Beam Instrumentation and Techniques

Demonstration of High Efficiency Diffractive Optics for Electrons Fabricated with Ion Beam Gas-Assisted Etching

Channeling Contrast Simulation of Secondary Electron Images in Scanning Ion Microscopes

Using Plasma Focused Ion Beam Microscopy to Characterize 3D Structure and Porosity of OPC Mortar

Current and Emerging Microscopy for Quantum Information Sciences

Emerging Microscopy for Quantum Information Sciences

Atomic Resolution CryoSTEM Across Continuously Variable Temperatures

New Advanced Electron Microscopy to Discover New Quantum Materials

Low Temperature Electron Microscopy of “Charge-Ordered” Phases

In situ Materials Characterization of 2-Dim Materials at High Energy and Spatial Resolution

Electron-Beam Manipulation of Lattice Impurities in Graphene and Single-Walled Carbon Nanotubes

Towards Atomic Scale Quantum Structure Fabrication in 2D Materials

Atomic-Scale Study of Intrinsic Defects Suppressing the Thermal Conductivity of Boron Arsenide

Double-Slit Electron Interference Experiment with Zero Propagation Distance Using Electron Biprism

High Spatial and Energy Resolution Analytical Scanning Transmission Electron Microscopy for Quantum Materials

Microstructure Effect on LaPtBi Superconductivity

Correlating Atomic-Scale Lattice and Nanoscale Structural Dynamics with Ultrafast Electron Microscopy

Tracking Quantum Effects at the Nanometer Scale with EELS and Cathodoluminescence

Advanced Scanning Transmission Electron Microscopy as a Tool for Direct Real-Space Visualization and Artificial Control of Quantum Spin Textures

STEM Study of Structure and Local Short-Range Orders in the Fe5−xGeTe2 Crystals with Ferromagnetism Near Room Temperature

Investigation of Spin Manipulation in Pt/CoFe2O4 via Scanning Transmission Electron Microscopy

Mapping Local Structural and Electronic Properties of 2D Materials by Multi-dimensional STEM

Microscopy and Microanalysis

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Volume 25 - Supplement S2 - August 2019

Analytical and Instrumentation Science Symposia

Advances in Focused Ion Beam Instrumentation and Techniques

Current and Emerging Microscopy for Quantum Information Sciences