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Using Plasma Focused Ion Beam Microscopy to Characterize 3D Structure and Porosity of OPC Mortar

Published online by Cambridge University Press:  05 August 2019

Peng Dong ,
Ali Allahverdi ,
Hui Yuan  and
Nabil D. Bassim
Peng Dong
Affiliation:
Department of Materials Science and Engineering and Canadian Centre for Electron Microscopy, McMaster University, Hamilton, ON, Canada.
Ali Allahverdi
Affiliation:
School of Chemical Engineering, Iran University of Science and Technology, Tehran, Iran.
Hui Yuan
Affiliation:
Department of Materials Science and Engineering and Canadian Centre for Electron Microscopy, McMaster University, Hamilton, ON, Canada.
Nabil D. Bassim*
Affiliation:
Department of Materials Science and Engineering and Canadian Centre for Electron Microscopy, McMaster University, Hamilton, ON, Canada.
*
*Corresponding author: bassimn@mcmaster.ca

Abstract

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Type
Advances in Focused Ion Beam Instrumentation and Techniques
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 926 - 927
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Holzer, L in “Review of FIB-tomography”, ed. Utke, I, (Oxford University Press, New York) p. 410.Google Scholar
[2]Bassim, N, Scott, K, and Giannuzzi, LA, MRS Bulletin 39 (2014), p. 317.Google Scholar
[3]Burnett, TL et al. , Ultramicroscopy 161 (2016), p. 119.Google Scholar
[4]Schankula, CC, Anand, , and Bassim, N, Computing and Software Report (2018).Google Scholar