Microscopy and Microanalysis: Volume 25 - Issue S2

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 25 - Supplement S2 - August 2019

Analytical and Instrumentation Science Symposia

Advances in Focused Ion Beam Instrumentation and Techniques

Plasma FIB Spin Milling for 3D Residual Stress Measurements

Passive Voltage Contrast Applications with Helium Ion Microscopy Imaging

Ar+ FIB Milling and Measurement of FIB Damage in Silicon

Characterization of Materials for Energy Storage and Production by Helium Ion Microscopy Coupled to Secondary Ion Mass Spectrometry

Analytics on the FIB: ORION-SIMS and the Discovery of a Unique Chondrite-like, Precambrian Impactor

Understanding Microstructural Evolution in ZrC Inoculated Zr47.5Cu45.5Al5Co2 Via High Resolution SIMS

Semi-Inverted Sample Preparation of Meteorites for High Resolution Analytical Electron Microscopy Using Correlative Raman Spectroscopy and Xe Plasma FIB

Novel FIB Torus Milling on Diamond Anvils with FIB Gasket Fabrication Enabling 5+ Megabar High Pressures Studies

“Stand-Out”: A Novel Approach for Preparing Sub-100 nm Samples Through in situ Ion Induced Bending

Detailed Investigation of Silicon Nitride Phase Plates Prepared by Focused Ion Beam Milling

Application of Ar Ion Beam Milling on Sectioning of Cells for SEM Observations

Xe Plasma vs Gallium FIB Delayering

Light Ion Beams Interacting with Thin Films

Helium Ion Microscopy Imaging of Bottlebrush Copolymers

A Method for FIB Liftout of Particles in Epoxy Resin

3D-Printed Lift Outs For EXLO and INLO Practice and Training

FIB Sample Preparation for In Depth EDS Analysis

In Situ Analysis of Cryoformed Metals by STEM

A Fast and Accurate Workflow for Analytic 3D FIB-SEM Tomography

Microstructural and Defect Characterization of Al-Si Alloy Using PFIB and EMPAD

Microscopy and Microanalysis

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Volume 25 - Supplement S2 - August 2019

Analytical and Instrumentation Science Symposia

Advances in Focused Ion Beam Instrumentation and Techniques