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Microstructural and Defect Characterization of Al-Si Alloy Using PFIB and EMPAD

Published online by Cambridge University Press:  05 August 2019

Robert E. A. Williams
Robert E. A. Williams*
Affiliation:
Center for Electron Microscopy and Analysis, The Ohio State University, Columbus, OH, USA.

Abstract

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Type
Advances in Focused Ion Beam Instrumentation and Techniques
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 920 - 921
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Sha, X et al. , Materials 11 (2018), p. 1151.Google Scholar
[2]Zhu, Y et al. , Ultramicroscopy 193 (2018), p. 12.Google Scholar
[3]Phillips, PJ et al. , Ultramicroscopy 111 (2011), p. 1483.Google Scholar
[4]Callahan, PG et al. , Ultramicroscopy 186 (2018), p. 49.Google Scholar
[5]Tate, M et al. , Microscopy and Microanalysis 22 (2016). p. 237.Google Scholar
[6]Unocic, K, Mills, MJ, and Daehn, GS, Journal of Microscopy 240 (2010), p. 227.Google Scholar
[7]Fisher, K and Marquis, E, Microscopy and Microanalysis 22 (2016), p. 692.Google Scholar
[8]Ernst, A, Wei, M, Aindow, MA, Microscopy and Microanalysis 23 (2017), p. 288.Google Scholar