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Microscopy and Microanalysis Microscopy and Microanalysis

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Double-Slit Electron Interference Experiment with Zero Propagation Distance Using Electron Biprism

Published online by Cambridge University Press:  05 August 2019

Ken Harada ,
Tetsuji Kodama ,
Tetsuya Akashi ,
Yoshio Takahashi ,
Keiko Shimada ,
Yoshimasa A. Ono ,
Daisuke Shindo ,
Hiroyuki Shinada  and
Shigeo Mori
Ken Harada
Affiliation:
CEMS, RIKEN (The Institute of Physical and Chemical Research), Hatoyama, Saitama, Japan Department of Materials Science, Osaka Prefecture University, Sakai, Osaka, Japan
Tetsuji Kodama
Affiliation:
Graduate School of Science & Technology, Meijo University, Nagoya, Aichi, Japan
Tetsuya Akashi
Affiliation:
Research & Development Group, Hitachi, Ltd., Hatoyama, Saitama, Japan Department of Applied Quantum Physics, Kyushu University, Fukuoka, Fukuoka, Japan
Yoshio Takahashi
Affiliation:
Research & Development Group, Hitachi, Ltd., Hatoyama, Saitama, Japan
Keiko Shimada
Affiliation:
CEMS, RIKEN (The Institute of Physical and Chemical Research), Hatoyama, Saitama, Japan
Yoshimasa A. Ono
Affiliation:
CEMS, RIKEN (The Institute of Physical and Chemical Research), Hatoyama, Saitama, Japan
Daisuke Shindo
Affiliation:
CEMS, RIKEN (The Institute of Physical and Chemical Research), Hatoyama, Saitama, Japan IMRAM, Tohoku University, Sendai, Miyagi, Japan
Hiroyuki Shinada
Affiliation:
Research & Development Group, Hitachi, Ltd., Hatoyama, Saitama, Japan
Shigeo Mori
Affiliation:
Department of Materials Science, Osaka Prefecture University, Sakai, Osaka, Japan

Abstract

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Type
Current and Emerging Microscopy for Quantum Information Sciences
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 944 - 945
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Harada, K et al. , Scientific Reports 8 (2018), p. 1008.CrossRefGoogle Scholar
[2]Harada, K et al. , Microsc. Microanal. 24 (2018), p. 1966.CrossRefGoogle Scholar
[3]Akashi, T et al. , Appl. Phys. Lett. 106 (2015), p. 074101.CrossRefGoogle Scholar
[4]Harada, K et al. , Appl. Phys. Lett. 84 (2004), p. 3229.CrossRefGoogle Scholar
[5]This work was supported by KAKENHI, Grant-in-Aid for Scientific Research ((B) 18H03475).Google Scholar
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