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In situ Materials Characterization of 2-Dim Materials at High Energy and Spatial Resolution

Published online by Cambridge University Press:  05 August 2019

Xuan Hu ,
Jacob R. Jokisaari ,
Serdar Ogut  and
Robert F. Klie
Xuan Hu
Affiliation:
University of Illinois at Chicago, Department of Physics, Chicago, IL, USA.
Jacob R. Jokisaari
Affiliation:
University of Illinois at Chicago, Department of Physics, Chicago, IL, USA.
Serdar Ogut
Affiliation:
University of Illinois at Chicago, Department of Physics, Chicago, IL, USA.
Robert F. Klie*
Affiliation:
University of Illinois at Chicago, Department of Physics, Chicago, IL, USA.
*
*Corresponding author: rfklie@uic.edu

Abstract

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Type
Current and Emerging Microscopy for Quantum Information Sciences
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 936 - 937
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Standley, B et al. , Nano Lett. 8 (2008), p. 3345.Google Scholar
[2]Han, W et al. , Nat Nano 9 (2014), p. 794.Google Scholar
[3]Hu, X et al. , Phys. Rev. Lett. 120 (2018), p. 055902.Google Scholar
[4]This work was supported by the National Science Foundation (EFMA-1542864 (EFRI)).Google Scholar