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Separation of EBIC Modes with Two-Channel STEM EBIC
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- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 2508-2509
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- August 2022
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Determining the Polarization Fraction of Thin Film Ferroelectric HZO with STEM EBIC
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 2270-2271
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- August 2022
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A Low-Noise, Two-Channel STEM EBIC Metrology System
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 794-795
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- August 2022
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In Situ Visualization of the Electron Wind Force in the Elastic Regime
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- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 106-107
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- August 2021
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Imaging Soft and Hard Dielectric Breakdown in Resistive Switching
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- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 2354-2355
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- August 2021
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Modern STEM EBIC: Emerging Modes and Methods
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- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 2350-2352
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- August 2021
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In Situ STEM Observations of Elemental Segregation in Phase Change Material GST Under Electrical and Thermal Stress
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- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 168-169
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- August 2021
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Electrical Isolation Preserved by Plasma Focused Ion Beam TEM Sample Preparation and Verified with STEM SEEBIC Imaging
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- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 194-195
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- August 2020
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Fingerprinting the Phases of Thin Film Ge2Sb2Te5 with EELS
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- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 904-905
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- August 2020
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Observation of Rectifying and Ohmic Grain Boundaries in Polycrystalline BaTiO3 Capacitors with STEM EBIC
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- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 374-375
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- August 2020
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Nanoparticle Temperature Measurements for MEMS Heater Calibration
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- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 1226-1227
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- August 2020
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STEM EBIC Thermometry Calibration with PEET on Al Nanoparticles
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- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 3124-3125
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- August 2020
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Identification of Biological Pathways to Alzheimer's Disease Using Polygenic Scores
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- European Psychiatry / Volume 41 / Issue S1 / April 2017
- Published online by Cambridge University Press:
- 23 March 2020, pp. S166-S167
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3 - Speedy Adjudication in Hard Cases and Low Settlement Rates in Easy Cases
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- Selection and Decision in Judicial Process around the World
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- 04 December 2019
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- 19 December 2019, pp 73-109
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2 - The Supreme Court of India
- from Part I - The Supreme Court of India – An Institutional Overview
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- A Qualified Hope
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- 19 August 2019
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- 29 August 2019, pp 43-76
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Inducing Electrically-Active Defects in a Gallium Arsenide Nanowire with an Electron Beam
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 1618-1619
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- August 2019
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Total Electron Yield Mapping of Electronic Device Features via Measurement of X-Ray Beam-Induced Currents
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 256-257
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- August 2019
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Secondary-Electron Electron-Beam-Induced Current Measurements at Lattice Resolution
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 1656-1657
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- August 2019
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Mapping Electronic State Changes with STEM EBIC
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 1396-1397
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- August 2019
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Mapping Ferroelectricity in Hafnia Thin Films with STEM EBIC
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 1846-1847
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- August 2019
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