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Mapping Electronic State Changes with STEM EBIC
Published online by Cambridge University Press: 05 August 2019
Abstract
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- Type
- In situ TEM Characterization of Dynamic Processes During Materials Synthesis and Processing
- Information
- Copyright
- Copyright © Microscopy Society of America 2019
References
[3]Janninck, RF and Whitmore, DH, Journal of Physics and Chemistry of Solids 27 (1966), p. 1183.Google Scholar
[5]This work was supported by National Science Foundation (NSF) award DMR-1611036, by NSF Science and Technology Center (STC) award DMR-1548924 (STROBE), and by the UCLA PSEIF.Google Scholar