25 results
Evaluation of Environmental Imaging for 200kV Field Emission Cs-corrected Analytical Scanning and Transmission Electron Microscope for Multi-User Facilities
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- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 918-919
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- July 2017
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Aberration Corrected Analytical Scanning and Transmission Electron Microscope for High-Resolution Imaging and Analysis for Multi-User Facilities
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 32-33
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- July 2016
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Interpretation of Energy-Filtered BSE Images at Ultra Low Voltage Conditions
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 34-35
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- August 2014
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High contrast BSE Imaging under Ultra Low Voltage condition by FE-SEM with Energy Filtering
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 1176-1177
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- August 2013
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The Development of A Large-Area Windowless Energy Dispersive X-ray Detector for STEM-EDX Analysis
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 1192-1193
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- August 2013
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Sample surface atomic resolution secondary electron imaging with an aberration corrected STEM
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
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- 23 November 2012, pp. 388-389
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- July 2012
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Reduce the electron damage in atomic resolved SEM observation using aberration corrected electron microscope.
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 374-375
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- July 2012
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Effects of chemical composition on the structural relaxation in ternary Zr-Cu-Al bulk glassy alloys studied by EXAFS and positron annihilation techniques.
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- MRS Online Proceedings Library Archive / Volume 1300 / 2011
- Published online by Cambridge University Press:
- 10 March 2011, mrsf10-1300-u09-38
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- 2011
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Naturally-Formed Nanoscale Phase Separation in Epitaxially-Grown III-V Semiconductor Alloys
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 1470-1471
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- July 2010
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Application of Lattice Strain Analysis of Semiconductor Device by Nano-beam Diffraction Using the 300 kV Cold-FE TEM
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 114-115
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- July 2009
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Flat rotation curves in Chern-Simons modified gravity
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- European Astronomical Society Publications Series / Volume 36 / 2009
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- 30 May 2009, pp. 99-100
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- 2009
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Development of Sample Preparation Method for Observation of Dopant Profile by Electron Holography
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 836-837
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- August 2008
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3D Elemental Mapping Using a Dedicated STEM Equipped with a Real-Time EELS Imaging System
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 1404-1405
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- August 2008
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A Method for Site-specific Specimen Preparation of Si Device after 65 nm-node Technology using FIB-STEM/TEM System
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- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 790-791
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- August 2007
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Atomic Scale Imaging and High Sensitive Elemental Analysis with an Aberration Corrected Dedicated STEM
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- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 886-887
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- August 2007
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Development of New Analytical Approaches by a 300 keV CFE-TEM/STEM
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1780-1781
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- August 2006
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A Method for 3 Dimensional Structural and Compositional Imaging of Nano-materials
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 528-529
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- August 2006
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3D Composition Imaging Using a Dedicated FIB/STEM System
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- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 630-631
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- August 2005
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FIB Micro-Pillar Sampling Technique For 3D Stem Observation And Its Application
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- Microscopy and Microanalysis / Volume 9 / Issue S02 / August 2003
- Published online by Cambridge University Press:
- 06 August 2003, pp. 118-119
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- August 2003
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Potential remedy against Echinococcus multilocularis in wild red foxes using baits with anthelmintic distributed around fox breeding dens in Hokkaido, Japan
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- Parasitology / Volume 125 / Issue 2 / August 2002
- Published online by Cambridge University Press:
- 16 January 2003, pp. 119-129
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