Hostname: page-component-7bb8b95d7b-lvwk9 Total loading time: 0 Render date: 2024-09-27T22:53:06.595Z Has data issue: false hasContentIssue false
  • English
  • Français

Development of New Analytical Approaches by a 300 keV CFE-TEM/STEM

Published online by Cambridge University Press:  31 July 2006

Y Taniguchi ,
T Furutsu ,
M Otsuka ,
K Nakamura ,
T Hashimoto ,
M Konno ,
T Yaguchi ,
S Terada ,
K Kaji  and
M Koguchi
...Show all authors
Y Taniguchi
Affiliation:
Hitachi High-Technologies Corporation
T Furutsu
Affiliation:
Hitachi High-Technologies Corporation
M Otsuka
Affiliation:
Hitachi High-Technologies Corporation
K Nakamura
Affiliation:
Hitachi High-Technologies Corporation
T Hashimoto
Affiliation:
Hitachi High-Technologies Corporation
M Konno
Affiliation:
Hitachi High-Technologies Corporation
T Yaguchi
Affiliation:
Hitachi High-Technologies Corporation
S Terada
Affiliation:
Central Research Laboratory,Hitachi Ltd
K Kaji
Affiliation:
Central Research Laboratory,Hitachi Ltd
M Koguchi
Affiliation:
Central Research Laboratory,Hitachi Ltd
T Matsumoto
Affiliation:
Central Research Laboratory,Hitachi Ltd

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Type
Abstract
Information
Microscopy and Microanalysis , Volume 12 , Issue S02 , August 2006 , pp. 1780 - 1781
Copyright
© 2006 Microscopy Society of America