Microscopy and Microanalysis: Volume 20 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 20 - August 2014

Advances in Instrumentation Symposia

Super Resolution Microscopic Methods

Abstract

Modeling Extensions of Fourier Ptychographic Microscopy

Super-resolved Ptychographic Imaging

Generalised Holography Meets Coherent Diffractive Imaging

Atomically Resolved Scanning Confocal Electron Microscopy Using a Double Aberration-corrected Transmission Electron Microscope

Towards High Resolution in TEM and STEM: What are the Limitations and Achievements

Resolution Enhancement at Low-Accelerating-Voltage by Improvements of Diffraction Limit and Chromatic Aberration

Maximum Efficiency STEM Phase Contrast Imaging

Experiments and Potentialities for the use of Bessel Beam in Superresolution STEM

The Use of Regularized Least Squares Minimization for the Deconvolution of SEM Images

Live Cell Imaging With Spatial Light Modulator-based Optical Sectioning Structured Illumination Microscopy

Crystallographic Structure Determination of MFI-Zeolite Nanosheets

High Speed, High Throughput Two Dimensional Direct Electron Detector Based on the Concept of pnCCDs

Microscopy and Spectroscopy for Power Generation and Energy Storage

Abstract

Nano-scale Characterization of Thin-Film Solar Cells

STEM-EELS Studies of the Local Structure and Coordination of Al2O3/Si interfaces in Si Solar Cells

Electron Microscopy of Organic Solar Cells Thermally Stabilized with Fullerene Nucleating Agents

Monochromated Electron Energy-Loss Spectroscopy Spectrum Imaging of Organic Photovoltaic Devices

Measurement of Atomic Fractions in Cu(In,Ga)Se2 Films by Auger Electron Spectroscopy (AES) and Energy Dispersive Electron Probe Microanalysis (ED-EPMA)

Artificial Photosynthesis: Solar Fuels Nanomaterials

Atom Dynamics at the Gas-Catalysts Interface with Atomic Resolution

Plasma Synthesis of Facetted Nickel nano-Ferrites with Controlled Stoichiometry

Microscopy and Microanalysis

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Volume 20 - August 2014

Advances in Instrumentation Symposia

Super Resolution Microscopic Methods

Abstract

Microscopy and Spectroscopy for Power Generation and Energy Storage

Abstract