Microscopy and Microanalysis: Volume 20 -

View selected items
Save to my bookmarks
Export citations
Download PDF (zip)
Save to Kindle
Save to Dropbox
Save to Google Drive
Save content to
To save this undefined to your undefined account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you used this feature, you will be asked to authorise Cambridge Core to connect with your undefined account. Find out more about saving content to .

To save this article to your Kindle, first ensure coreplatform@cambridge.org is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about saving to your Kindle.

Note you can select to save to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be saved to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

Please be advised that item(s) you selected are not available.
You are about to save
Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
Your Kindle email address

Please provide your Kindle email.

@free.kindle.com @kindle.com (service fees apply)

By using this service, you agree that you will only keep content for personal use, and will not openly distribute them via Dropbox, Google Drive or other file sharing services

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Volume 20 - August 2014

Advances in Instrumentation Symposia

Electron Holography at the Atomic Scale and the Nanoscale

Abstract

Characterization of Metallic and Bimetallic Nanoparticles by Off-Axis Electron Holography

Propagation of Free Electrons Carrying Orbital Angular Momentum Through Magnetic Lenses

15 Years of Focused Ion Beams at M & M

Abstract

FIB Applications: A Historical Perspective

Optimization of High Current Xenon Plasma Ion Beams for Applications in Semiconductor Failure Analysis and Development

High Speed TEM Sample Preparation by Xe FIB

He+ Ions for 3D Imaging

Monte Carlo Modeling of Ion Beam Induced Secondary Electrons

1970-2014: From Space Ion Thrusters to Nano-Tools

Insulator Analysis Using Combined FIB-SEM instrument with TOF-SIMS

Optimized Detection Limits in FIB-SIMS by Using Reactive Gas Flooding and High Performance Mass Spectrometers

Ion-induced Auger Electron Spectroscopy as a Potential Route to Chemical Focused-Ion Beam Tomography

Advanced Ion Source Technology for High Resolution and Stable FIB Nanofabrication employing Gallium and new Ion Species

Application of a FIB/SEM to Study the Occlusion of Dentine Tubules from a Calcium Sodium Phosphosilicate Bioactive Glass (Novamin)

From Oil Field to Ptychography: Applications of FIB SEM in NanoGeoScience

3D Nanoscale Analysis Using Focused Ion Beam Tomography of Carbonaceous Nanoglobules in Matrix Materials from the Tagish Lake Meterorite

In situ FIB-SEM Experimentation: from Nanoscale Wetting to Nanofabrication of Gallium-based Liquid Metals

15 Years of Characterizing Titanium Alloys' Microstructure by DBFIB

FIB Lift Out of Columnar Carbon Structures

Advancing Materials Characterization in the FIB-SEM with Transmission Kikuchi Diffraction

Cryo-FIB Minimizes Ga+ Milling Artifacts in Sn

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Save Search

Volume 20 - August 2014

Advances in Instrumentation Symposia

Electron Holography at the Atomic Scale and the Nanoscale

Abstract

15 Years of Focused Ion Beams at M & M

Abstract