Microscopy and Microanalysis: Volume 20 -

View selected items
Save to my bookmarks
Export citations
Download PDF (zip)
Save to Kindle
Save to Dropbox
Save to Google Drive
Save content to
To save this undefined to your undefined account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you used this feature, you will be asked to authorise Cambridge Core to connect with your undefined account. Find out more about saving content to .

To save this article to your Kindle, first ensure coreplatform@cambridge.org is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about saving to your Kindle.

Note you can select to save to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be saved to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

Please be advised that item(s) you selected are not available.
You are about to save
Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
Your Kindle email address

Please provide your Kindle email.

@free.kindle.com @kindle.com (service fees apply)

By using this service, you agree that you will only keep content for personal use, and will not openly distribute them via Dropbox, Google Drive or other file sharing services

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Volume 20 - August 2014

Advances in Instrumentation Symposia

15 Years of Focused Ion Beams at M & M

Abstract

Integration of Cryo-FIB-SEM Imaging into Dynamic Thermo-fluidic Experimentation: Applications to Multifunctional Nanoengineered Surface Design

Ga+ Ions and Xe+ Plasma: Complementary FIBs for Resin-Embedded Life Science Sample Analyses

Xenon Focused Ion Beam in the Shape Memory Alloys Investigation - The Case of NiTi and CoNiAl

Focused Helium Ion Beam Nanomachining of Thin Membranes vs. Bulk Substrates

Advantages of Helium and Neon Ion Beams for Intelligent Imaging

Ex situ Lift Out of PFIB Prepared TEM Specimens

In-Situ Quantification of TEM Lamella Thickness and Ga Implantation in the FIB

Site Specific TEM Specimen Preparation for Characterization of Extended Defects in 4H-SiC Epilayers

Ga+ FIB Milling and Measurement of FIB Damage in Sapphire

Blunted Tungsten Tip Cleaning by Nitrogen Gas Etching at Room Temperature without Tip Heating and Cooling

A Focused Ion Beam Specimen Preparation Method to Minimize Gallium Ion Concentration in Copper Atom-Probe Tomography Specimen Tips

FIB Preparation of Bone-Implant Interfaces for Correlative On-Axis Rotation Electron Tomography and Atom Probe Tomography

3D Atom Probe Microscopy Sample Preparation by Using L-Shape FIB-SEM-Ar Triple Beam

Efficient Diffractive Phase Optics for Electrons

Focused Ion Beam Direct Write Nanofabrication of Surface Phonon Polariton Metamaterial Nanostructures

In-Situ Investigations of Individual Nanowires within a FIB/SEM System

3D Analytical TEM Approach to Effectively Characterize 3D-FinFET Device Features in Semiconductor Wafer-foundries

Gas-Mediated Electron Beam Induced Etching - From Fundamental Physics to Device Fabrication

An Improved Specimen Preparation of Porous Powder Materials for Transmission Electron Microscopy

Super Resolution Microscopic Methods

Abstract

Coherent Diffraction Imaging

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Save Search

Volume 20 - August 2014

Advances in Instrumentation Symposia

15 Years of Focused Ion Beams at M & M

Abstract

Super Resolution Microscopic Methods

Abstract