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[1]Muto, S., et al., Journal of The Electrochemical Society (2009. 156(5): A371.
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[2]Zheng, S., et al., Journal of The Electrochemical Society (2011. 158(4): A357.
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[3]David, B. W., et al., Transmission electron microscopy, Springer, New York (2009.
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[4] This work was supported by the IT R&D Program of MKE/KEIT [10041856, Technology development for life improvement of high Ni composition cathode at high temperature (> 60 °C)].