Hostname: page-component-76fb5796d-5g6vh Total loading time: 0 Render date: 2024-04-26T15:28:50.498Z Has data issue: false hasContentIssue false
  • English
  • Français

Resolution Enhancement at Low-Accelerating-Voltage by Improvements of Diffraction Limit and Chromatic Aberration

Published online by Cambridge University Press:  27 August 2014

H. Sawada ,
T. Sasaki ,
F. Hosokawa  and
K. Suenaga
H. Sawada
Affiliation:
JEOL Ltd., 3-1-2 Musashino, Akishima, Tokyo, 196-8558, Japan
T. Sasaki
Affiliation:
JEOL Ltd., 3-1-2 Musashino, Akishima, Tokyo, 196-8558, Japan
F. Hosokawa
Affiliation:
JEOL Ltd., 3-1-2 Musashino, Akishima, Tokyo, 196-8558, Japan
K. Suenaga
Affiliation:
National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, 305-8565, Japan

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 380 - 381
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Suenaga, K., and Koshino, M Nature 468 (2010),p. 1088.Google Scholar
[2] Krivanek, O. L., et al, Nature 464 (2010),p. 571.Google Scholar
[3] Lee, Z., et al, Ultramiscoscopy 112 (2012), p. 39.Google Scholar
[4] Sawada, H, et al, J. Electron Microsc. 58 (2009), p. 357.Google Scholar
[5] Sasaki, T., et al, J. Electron Microsc. 59 (2010), p. S7.Google Scholar
[6] O'Keefe, M., et al, J. Electron Microsc. 54 (2005), p. 169.Google Scholar
[7] Hosokawa, F., et al, unpublished (2013).Google Scholar
[8] Sawada, H., et al, Micron (2013) DOI : 10.1016/j.micron.2014.01.007.Google Scholar