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Atomically Resolved Scanning Confocal Electron Microscopy Using a Double Aberration-corrected Transmission Electron Microscope

Published online by Cambridge University Press:  27 August 2014

Peng Wang
Affiliation:
National Laboratory of Solid State Microstructures and College of Engineering and Applied sciences, Nanjing University, Nanjing 210093, People’s Republic of China
Angus I. Kirkland
Affiliation:
Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH, UK
Peter D. Nellist
Affiliation:
Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH, UK
Adrian J. D’Alfonso
Affiliation:
School of Physics, University of Melbourne, Parkville, Victoria 3010, Australia
Andrew J. Morgan
Affiliation:
School of Physics, University of Melbourne, Parkville, Victoria 3010, Australia
Leslie J. Allen
Affiliation:
School of Physics, University of Melbourne, Parkville, Victoria 3010, Australia
Ayako Hashimoto
Affiliation:
Surface Physics and Structure Unit, National Institute for Materials Science, 1-2-1 Sengen, Tsukuba, 305-0047, Japan Global Research Center for Environment and Energy based on Nanomaterials Science, National Institute for Materials Science, 1-2-1 Sengen, Tsukuba, 305-0047, Japan Electron Microscopy Station, National Institute for Materials Science, 1-2-1 Sengen, Tsukuba, 305-0047, Japan
Masaki Takeguchi
Affiliation:
Surface Physics and Structure Unit, National Institute for Materials Science, 1-2-1 Sengen, Tsukuba, 305-0047, Japan Electron Microscopy Station, National Institute for Materials Science, 1-2-1 Sengen, Tsukuba, 305-0047, Japan
Kazutaka Mitsuishi
Affiliation:
Surface Physics and Structure Unit, National Institute for Materials Science, 1-2-1 Sengen, Tsukuba, 305-0047, Japan Global Research Center for Environment and Energy based on Nanomaterials Science, National Institute for Materials Science, 1-2-1 Sengen, Tsukuba, 305-0047, Japan Electron Microscopy Station, National Institute for Materials Science, 1-2-1 Sengen, Tsukuba, 305-0047, Japan
Masayuki Shimojo
Affiliation:
Department of Materials Science and Engineering, Shibaura Institute of Technology, 3-7-5, Toyosu, Koto-ku, Tokyo, 135-8548, Japan

Abstract

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Type
Abstract
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Nellist, P.D.and Wang, P. Annual Review of Materials Research, Annual Reviews 42 2012), p. 125143.Google Scholar
[2] Mitsuishi, K., et al Ultramicroscopy 111 2010) p20-26.Google Scholar
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[8] Wang, P., et al Ultramicroscopy 134 2013) p185-192.Google Scholar
[9] Financial support from the Leverhulme Trust (F/08 749/B), the EPSRC (EP/F048009/1) and the ARC's Discovery Projects funding scheme (DP110102228) is gratefully acknowledged.Google Scholar