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Maximum Efficiency STEM Phase Contrast Imaging

Published online by Cambridge University Press:  27 August 2014

Timothy J. Pennycook ,
Andrew R. Lupini ,
Lewys Jones  and
Peter D. Nellist
Timothy J. Pennycook
Affiliation:
Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH, UK SuperSTEM Laboratory, Daresbury, WA4 4AD, UK
Andrew R. Lupini
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA
Lewys Jones
Affiliation:
Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH, UK
Peter D. Nellist
Affiliation:
Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH, UK SuperSTEM Laboratory, Daresbury, WA4 4AD, UK

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 382 - 383
Copyright
Copyright © Microscopy Society of America 2014 

References

References:

[1] Lee, S. et al. Ultramicroscopy, 125 (2013), p. 43.Google Scholar
[2] Shibata, N., et al, Nature Physics, 8 (2012), 611.Google Scholar
[3] Kimoto, K., Ishizuka, K. Ultramicroscopy, 111 (2011), p. 1111.Google Scholar
[4] Rodenburg, J. M., McCallum, B. C., Nellist, P. D. Ultramicroscopy, 48, (1993), p. 303.Google Scholar
[5] This research was supported by the EPSRC through the UK National Facility for Aberration-Corrected STEM (SuperSTEM). Research at Oak Ridge National Laboratory was sponsored by the US Department of Energy, Office of Science, Materials Sciences and Engineering Division.Google Scholar