Microscopy and Microanalysis: Volume 22 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 22 - February 2016

Analytical and Instrumentation Science Symposia

Single Atom Electron Microscopy and Spectroscopy

Abstract

Single Atom Spectroscopy in Low-Dimensional Materials using Low-voltage STEM

Strain Accommodation and Coherency in Laterally-Stitched WSe2/WS2Junctions

ZnO Nanowire Supported Metal Single Atoms for CO oxidation

Quantification of the Effects of Small Mistilts on Dopant Visibility in Nanocrystals

Imaging at the Single-Atom Level in Closed-CellIn SituGas Reactions

Performance of the SALVE-microscope: Atomic-resolution TEM Imaging at 20 kV

Engineering the Contrast Transfer through the Cc/Cs Corrected 20-80 kV SALVE Microscope

Correlation Averaging of Single-Atomic-Column STEM-EDX Images for Sub-Atomic Information

Atomic Resolution Studies of W Dopants Effect on the Phase Transformation of VO2

Quantitative Measurement of Intensities and Distances in Electron Microscopy

Abstract

Quantification and Sensible Correction for Energy-Loss- and Thickness-Dependent Contrast Complications in Atomic-Scale Electron Energy-Loss Spectroscopy

Misalignment Induced Artifacts in Quantitative Annular Bright-Field Imaging

Sample Tilt Effects on Atom Column Position Determination in ABF-STEM Imaging

Quantitative, Real-Space Statistical Analysis of Imperfect Lattices

Experimental Contrast of Atomically-resolved Cc/Cs-corrected 20-80kVSALVEImages of 2D-objects Matches Calculations

Quantification of ADF STEM Image Data for Nanoparticle Structure and Strain Measurements

Imaging Local Polarization and Domain Boundaries with Picometer-Precision Scanning Transmission Electron Microscopy

Distortion Correction in Scanning Transmission Electron Microcopy with Controllable Scanning Pathways

Three-Dimensional Imaging of Single La Vacancies in LaMnO3

Tracking BO6Coupling in Perovskite Superlattices to Engineer Magnetic Interface Behavior

Direct Electromagnetic Structure Observation by Aberration-corrected Differential Phase Contrast Scanning Transmission Electron Microscopy

Microscopy and Microanalysis

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Volume 22 - February 2016

Analytical and Instrumentation Science Symposia

Single Atom Electron Microscopy and Spectroscopy

Abstract

Quantitative Measurement of Intensities and Distances in Electron Microscopy

Abstract