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Correlation Averaging of Single-Atomic-Column STEM-EDX Images for Sub-Atomic Information

Published online by Cambridge University Press:  25 July 2016

Jong Seok Jeong  and
K. Andre Mkhoyan
Jong Seok Jeong
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, MN 55455, United States
K. Andre Mkhoyan
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, MN 55455, United States

Abstract

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Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 882 - 883
Copyright
© Microscopy Society of America 2016 

References

References:

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[7] This work was supported by NSF MRSEC under award DMR-1420013. STEM analysis was carried out in the Characterization Facility of the University of Minnesota, which receives partial support from the NSF through the MRSEC program.Google Scholar