Microscopy and Microanalysis: Volume 22 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 22 - February 2016

Analytical and Instrumentation Science Symposia

In-Situ Electron Microscopy and Big Data Analytics in 2D and 3D

Abstract

Kinetics of Sodium and Selenium Reactions in Sodium Ion Batteries

Aluminum Nanoparticles as Fiducials for Nanoscale Temperature Measurements

In-Situ Study of Domain Walls Propagation and Pinning in Modulated Magnetic Nanowires.

Electrical Probing of Silver Nanowires in situ Transmission Electron Microscopy

Understanding the Effect of Additives in Li-Sulfur Batteries byOperando ec-(S)TEM

A Xe+Plasma FIB Milling and Lift-out Approach for Site-specific Preparation of Large Volume Blocks for 3D-EBSD

Nucleation and Crystal Growth of Zn0.3In1.4Sn0.3O3 (ZITO-30) Thin Films Studied byin-situTEM

Nano-manipulation of Ag/ZnO Nanoantennas forin-situTEM Electrical Measurements

In-situ TEM Investigation on Thermal Stability and Oxygen Release Behavior of Charged and Discharged LiCoO2

Single Atom Electron Microscopy and Spectroscopy

Abstract

Electron Diffraction from a Single Atom and Optimal Signal Detection

In-line Holography with Single Atom Sensitivity: Challenges and Achievements

Exploration of Single-Atom X-ray Analysis in an Analytical Electron Microscope

Observation of Single Atoms in Liquid and Liquid Inhomogeneous Structures

Microscopy and Spectroscopy of Catalysts and Energy Storage Materials

Dynamic Aberration-corrected STEM of Bimetallic Nanocatalysts during Surface Diffusion

Atomically Dispersed Precious Metal Species on Various Oxide Supports for Catalytic Hydrogen Upgrading and Emission Control

Catalysis by Supported Single Metal Atoms

Single Atom Imaging and Spectroscopy of Impurities in 2D Materials

Z-contrast imaging as a tool for atomic level analysis of bimetallic structures

Every Atom has a Story to Tell: Using Single-Atom-Sensitivity Imaging and Spectroscopy to Determine Origins of Cosmic Nanodiamonds

Microscopy and Microanalysis

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Volume 22 - February 2016

Analytical and Instrumentation Science Symposia

In-Situ Electron Microscopy and Big Data Analytics in 2D and 3D

Abstract

Single Atom Electron Microscopy and Spectroscopy

Abstract