Microscopy and Microanalysis: Volume 22 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

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Microscopy and Microanalysis

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Volume 22 - February 2016

Analytical and Instrumentation Science Symposia

Quantitative Measurement of Intensities and Distances in Electron Microscopy

Abstract

Atomic Level Structure-Property Relationship in a Spin-Orbit Mott insulator: Scanning Transmission Electron and Scanning Tunneling Microscopy Studies

Atomic Resolution Distortion Analysis of Yttrium-Doped Barium Zirconate

Exploring Thermal Properties of M0S2 Using In Situ Quantitative STEM

Aberration Corrected STEM Imaging of Domain Walls in Congruent LiNbO3

Three-Dimensional Determination of the Coordinates of Individual Atoms in Materials

Reconstruction of the Nanoscale Three-Dimensional Mass-Density Autocorrelation Function of Individual Cells

Retrieving Atomic Structure from Dynamical Rocking Curve Measurements in both Real and Reciprocal Space

Quantitative Comparison of Phase Contrast Imaging in Conventional TEM Focal Series and STEM Ptychography

An Extended Ageing Study of a Uranium Dioxide Layer on Uranium Metal using the EDS/XPP Method

Electron Beam Induced Mass Loss Dependence on Stained Thin Epon Resin Sections

Image Processing of Energy Filtered Transmission Electron Microcopy Maps in Order to Extract Nano Scale Magnetic Properties of CoCr-based Magnetic Thin Films

Oxygen Octahedral Picker: A Digital Micrograph Script Tool for Extracting Quantitative Information From HAADF and ABF Images

Extraction of Quantitative Information from Non-optimum-focus Aberration-corrected HRTEM Images by Image Processing

Effect of Probe Channeling on Differential Phase Contrast at the Atomic Scale

Evaluation of Electron Microscopy Techniques for the Purpose of Classification of Nanomaterials.

High-Throughput, Semi-Automated Quantitative STEM Atom Counting in Supported Metal Nanoparticles Using a Conventional TEM/STEM

Development of Real-Time Probe Current Calibration for Performing Quantitative STEM with a Cold Field-Emission Gun.

Exploring Boltzmann-Factor Distributions of Precipitation-Nuclei in the TEM.

Determining Interplanar Distances from STEM-EDX Hyperspectral Maps

Challenges of Oversimplifying Z-contrast in Atomic Resolution ADF-STEM

Microscopy and Microanalysis

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Volume 22 - February 2016

Analytical and Instrumentation Science Symposia

Quantitative Measurement of Intensities and Distances in Electron Microscopy

Abstract