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Exploring Thermal Properties of M0S2 Using In Situ Quantitative STEM

Published online by Cambridge University Press:  25 July 2016

Jared M Johnson
Affiliation:
Department of Materials Science and Engineering, The Ohio State University, Columbus, OH43212
Choong Hee Lee
Affiliation:
Department of Electrical and Computer Engineering, The Ohio State University, Columbus, OH43210
Siddharth Rajan
Affiliation:
Department of Electrical and Computer Engineering, The Ohio State University, Columbus, OH43210
William McCulloch
Affiliation:
Department of Chemistry, The Ohio State University, Columbus, OH, 43210
Yiying Wu
Affiliation:
Department of Chemistry, The Ohio State University, Columbus, OH, 43210
Jinwoo Hwang
Affiliation:
Department of Materials Science and Engineering, The Ohio State University, Columbus, OH43212
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Abstract

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Copyright
© Microscopy Society of America 2016 

References

[1] Balandin, A., et al., Journal of Nanoelectronics and Optoelectronics 2, 140 (2007).CrossRefGoogle Scholar
[2] Polanco, C., et al., Nanoscale and Microscale Thermophysical Engineering 17, 263 (2013).CrossRefGoogle Scholar
[3] Krivanek, O. L., et al., Nature 514, 209 (2014).CrossRefGoogle Scholar
[4] LeBeau, , et al., Phys. Rev Lett 100, 206101 (2008).Google Scholar
[5] Peng, , et al., Acta Cryst A52, 456 (1996).CrossRefGoogle Scholar
[6] Afanasiev, , et al., Chem. Mater 14(2826 (2002). Youn et al., Scientific Reports 4, 5492 (2014).CrossRefGoogle Scholar
[7] Mannebach, , et al., Nano Lett. 15, 6889 (2015).CrossRefGoogle Scholar
[8] Lee, , et al., Appl. Phys. Lett. 107, 193503 (2015).CrossRefGoogle Scholar
[9] Mele, , et al., Microscopy Research and Technique (in print).Google Scholar
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