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Single Atom Imaging and Spectroscopy of Impurities in 2D Materials

Published online by Cambridge University Press:  25 July 2016

Wu Zhou ,
Andrew R. Lupini ,
Junhao Lin ,
Yongji Gong ,
Zheng Liu ,
Myron D. Kapetanakis ,
Mark P. Oxley ,
Juan-Carlos Idrobo ,
Stephen J. Pennycook  and
Sokrates T. Pantelides
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Wu Zhou
Affiliation:
Materials Science & Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA
Andrew R. Lupini
Affiliation:
Materials Science & Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA
Junhao Lin
Affiliation:
Materials Science & Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA Department of Physics and Astronomy, Vanderbilt University, Nashville, TN37235, USA
Yongji Gong
Affiliation:
Department of Chemistry, Department of Materials Science and NanoEngineering, Rice University, Houston, TX 77005, USA
Zheng Liu
Affiliation:
School of Materials Science & Engineering, Nanyang Technological University, 639798, Singapore
Myron D. Kapetanakis
Affiliation:
Materials Science & Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA Department of Physics and Astronomy, Vanderbilt University, Nashville, TN37235, USA
Mark P. Oxley
Affiliation:
Materials Science & Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA
Juan-Carlos Idrobo
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN37831, USA
Stephen J. Pennycook
Affiliation:
Department of Materials Science & Engineering, National University of Singapore, 117575, Singapore
Sokrates T. Pantelides
Affiliation:
Materials Science & Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA Department of Physics and Astronomy, Vanderbilt University, Nashville, TN37235, USA
Pulickel M. Ajayan
Affiliation:
Department of Chemistry, Department of Materials Science and NanoEngineering, Rice University, Houston, TX 77005, USA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 862 - 863
Copyright
© Microscopy Society of America 2016 

References

[1] Gong, Y, et al, Nano Lett. 14 (2014). p 442–449.Google Scholar
[2] Lin, J, Pantelides, ST & Zhou, W ACS Nano 9 (2015). p. 5189–5197.Google Scholar
[3] Zhou, W, et al, Phys. Rev. Lett 109 (2012). p 206803.Google Scholar
[4] Zhou, W, et al, Nature Nanotech 7 (2012). p 161–165.Google Scholar
[5] Kapetanakis, MD, et al, submitted (2016).Google Scholar
[6] Research sponsored by the U.S. Department of Energy, Office of Science, Basic Energy Science, Materials Sciences and Engineering Division, and ORNL’s Center for Nanophase Materials Sciences (CNMS), which is a DOE Office of Science User Facility.Google Scholar