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Imaging Local Polarization and Domain Boundaries with Picometer-Precision Scanning Transmission Electron Microscopy

Published online by Cambridge University Press:  25 July 2016

Megan E. Holtz ,
Julia A. Mundy ,
Celesta S. Chang ,
Jarrett A. Moyer ,
Charles M. Brooks ,
Hena Das ,
Alejandro F. Rebola ,
Robert Hovden ,
Elliot Padgett  and
Craig J. Fennie
...Show all authors
Megan E. Holtz
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA
Julia A. Mundy
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA
Celesta S. Chang
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA
Jarrett A. Moyer
Affiliation:
Department of Physics and Materials Research Institute, University of Illinois at Urbana-Champaign, Urbana, IL, USA
Charles M. Brooks
Affiliation:
Department of Materials Science and Engineering, Cornell University, Ithaca, NY, USA
Hena Das
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA
Alejandro F. Rebola
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA
Robert Hovden
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA
Elliot Padgett
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA
Craig J. Fennie
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA
Peter Schiffer
Affiliation:
Department of Physics and Materials Research Institute, University of Illinois at Urbana-Champaign, Urbana, IL, USA
Dennis Meier
Affiliation:
Department of Materials, ETH Zürich, CH-8093 Zürich, Switzerland
Darrell G. Schlom
Affiliation:
Department of Materials Science and Engineering, Cornell University, Ithaca, NY, USA Kavli Institute at Cornell for Nanoscale Science, Ithaca, NY, USA
David A. Muller
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA Kavli Institute at Cornell for Nanoscale Science, Ithaca, NY, USA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 898 - 899
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Das, H, et al, Nat. Comm 5 (2014) 2889.CrossRefGoogle Scholar
[2] Yankovich, A, et al, Nat. Comm 5 (2014) 4155.CrossRefGoogle Scholar
[3] Work supported by the U.S. DOE BES, Award #DE-SC0002334. EM Facility support from the NSF MRSEC program (DMR 1120296).Google Scholar