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Sample Tilt Effects on Atom Column Position Determination in ABF-STEM Imaging

Published online by Cambridge University Press:  25 July 2016

Dan Zhou
Affiliation:
Stuttgart Center for Electron Microscopy, Max Planck Institute for Solid State Research, Heisenbergstr. 1, Stuttgart, Germany
Knut Müller-Caspary
Affiliation:
Institut für Festkörperphysik, Universität Bremen, Otto-Hahn-Allee 1, 28359, Bremen, Germany
Wilfried Sigle
Affiliation:
Stuttgart Center for Electron Microscopy, Max Planck Institute for Solid State Research, Heisenbergstr. 1, Stuttgart, Germany
Florian F. Krause
Affiliation:
Institut für Festkörperphysik, Universität Bremen, Otto-Hahn-Allee 1, 28359, Bremen, Germany
Andreas Rosenauer
Affiliation:
Institut für Festkörperphysik, Universität Bremen, Otto-Hahn-Allee 1, 28359, Bremen, Germany
Peter A. van Aken
Affiliation:
Stuttgart Center for Electron Microscopy, Max Planck Institute for Solid State Research, Heisenbergstr. 1, Stuttgart, Germany
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Abstract

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© Microscopy Society of America 2016 

References

[1] Okunishi, E., et al, Microsc Microanal 15 (2009) 164165.CrossRefGoogle Scholar
[2] Findlay, S.D., et al, Appl Phys Lett 95 (2009).CrossRefGoogle Scholar
[3] Huang, R., et al, Adv Funct Mater 24 (2014) 793799.CrossRefGoogle Scholar
[4] The authors thank Prof. H.-U. Habermeier for providing the ZrO2-LSMO sample and Marion Kelsch for preparing the plan-view TEM sample, both Max Planck Institute for Solid State Research. The research leading to these results has received funding from the European Union Seventh Framework Programme [FP7/2007-2013] under grant agreement n°312483 (ESTEEM2) and from the Deutsche Forschungsgemeinschaft under contracts RO2057/4-2 and MU3660/1-1. Dan Zhou would also like to thank her current advisor Prof. Paul M. Voyles for supporting her attendace of M&M 2016 to present her PhD work.Google Scholar
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Sample Tilt Effects on Atom Column Position Determination in ABF-STEM Imaging
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