Microscopy and Microanalysis: Volume 24 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 24 - August 2018

Analytical and Instrumentation Science Symposia

The Joy of Scanning Electron Microscopy

Abstract

Grain Evolution in Thermally Aged Cast and Hot Isostatic Pressed Inconel 625

Structural Analyses of a Spherulite Mineral Using SEM, CL, and EDX

Determination of Triclinic Bravais Lattice by Means of EBSD Pattern

Bravais Lattice of TiAl Determined from a Single Electron Backscatter Diffraction Pattern

Identification of SiC Crystals Based on 3D Reconstruction Using EBSD Technique

Insights Into the Structure of the Ligand Capping Layer of Inorganic Nanostructures via Multi kV Electron Microscopy Analysis

Characterization by Raman and Scanning Electron Microscopy of LiNbO3 Powders Obtained by Mechanochemical and Calcination Route

Rapid Diagnosis of Soil Nutrients Using Microscopic Techniques.

The Effects of Evactron® Plasma Cleaning on Moxtek® X-ray Windows

EDS and VP-SEM: Practical Considerations and Challenges

Crystal Grain Observation Using a Segmented Backscattered Electron Detector

Beam Deceleration Leads to Superior Image Quality of Biological Samples Analyzed in the Scanning Electron Microscope

Facets on Spherical Particles in Al65Cu20Fe15 Alloy

Electron/Ion Channeling Contrast Imaging and Grayscale Image Analysis Using 3C-SiC Twin Structures

High-Temperature BSE and EBAC Electronics for ESEM

Effective Degradation of Humic Acids in Water by Zero Fenton Process

Sensitivity Analysis of Simulated Backscattered Electron Emission against Electron Dosage of Buried Semiconductor Features

Exemplar-Based Inpainting Based on Dictionary Learning for Sparse Scanning Electron Microscopy

Scanning Electron Microscope, an Essential Equipment for Failure Analysis

Solid-state X-ray Spectrometry at 50 Years

Abstract

The Beginnings of EDS in EPMA

Microscopy and Microanalysis

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Volume 24 - August 2018

Analytical and Instrumentation Science Symposia

The Joy of Scanning Electron Microscopy

Abstract

Solid-state X-ray Spectrometry at 50 Years

Abstract