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High-Temperature BSE and EBAC Electronics for ESEM

Published online by Cambridge University Press:  01 August 2018

Wolfgang Joachimi ,
Matthias Hemmleb ,
Uwe Grauel ,
Zhu-Jun Wang ,
Marc Willinger  and
Grigore Moldovan
Wolfgang Joachimi
Affiliation:
point electronic GmbH, Erich-Neuß-Weg 15, Halle, Germany
Matthias Hemmleb
Affiliation:
point electronic GmbH, Erich-Neuß-Weg 15, Halle, Germany
Uwe Grauel
Affiliation:
point electronic GmbH, Erich-Neuß-Weg 15, Halle, Germany
Zhu-Jun Wang
Affiliation:
Department of Inorganic Chemistry, Fritz Haber Institute of the Max Planck Society, Berlin, Germany
Marc Willinger
Affiliation:
Department of Inorganic Chemistry, Fritz Haber Institute of the Max Planck Society, Berlin, Germany Scientific Center for Optical and Electron Microscopy-ScopeM, ETH Zurich, Zurich, Switzerland
Grigore Moldovan
Affiliation:
point electronic GmbH, Erich-Neuß-Weg 15, Halle, Germany

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 694 - 695
Copyright
© Microscopy Society of America 2018 

References

[1] Wang, Z.-J., et al, ACS Nano 9 2015) p. 1506.Google Scholar
[2] Poitel, S., et al, ECS Trans. 78(1 2017) p. 1615.Google Scholar
[3] Hemmleb, M., et al, EMC Proc 2016) p. 489.Google Scholar