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Article contents
Electron/Ion Channeling Contrast Imaging and Grayscale Image Analysis Using 3C-SiC Twin Structures
Published online by Cambridge University Press: 01 August 2018
Abstract
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- Type
- Abstract
- Information
- Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 692 - 693
- Copyright
- © Microscopy Society of America 2018
References
[1] Spence, J. C. H. in Electron Diffraction Techniques Volume 1” (ed. J. M. Cowley
Oxford University Press
New York
p. 465.Google Scholar