Microscopy and Microanalysis: Volume 24 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 24 - August 2018

Analytical and Instrumentation Science Symposia

Solid-state X-ray Spectrometry at 50 Years

Abstract

EDS Analysis at Low Beam Currents Facilitated by a Large Area Silicon Drift Detector

Quantitative Elemental Mapping of Alkali Activated Slag Cement

Solid State X-ray Fluorescence Spectrometry at the J Paul Getty Museum 1977-78

Combined Energy Dispersive Spectrometry/W avelength Dispersive Spectrometry Analysis of Geological Materials Using an Electron Probe Microanalyzer

The Performance of Energy Dispersive X-ray Analysis at high Temperatures using a windowless Multi Detector XEDS System

Silicon Drift Detectors in Electron Microscopy - An Over 20 Year History with a Bright Future

Quantitative Analysis of Energy-Dispersive Spectra Acquired with Large Solid Angle Detectors

Structural Characterization of Cu10Mo Alloy Synthesized by Mechanical Alloying

The FIB-SEM Laboratory: Sample Preparation and Beyond

Abstract

Time of Flight Backscatter and Secondary Ion Spectrometry in a Helium Ion Microscope

COLDFIB - The New FIB Source from Laser Cooled Atoms

Using FIB-SEM as a Platform for the Positioning and Correlated Characterization of III-V Nanowires

Control and in-situ imaging of heat & gas mediated processes in FIB/SEM system

Using Three-Dimensional Electron Backscatter Diffraction Data to Measure Grain Boundary Properties in Metals and Ceramics

The Challenges of High-Resolution Analytic FIB-SEM Tomography and Their Solution

3D Microstructure Reconstruction and Characterization of Solid-State Electrolyte with Varying Porosity

Crystallography at the Nanoscale: t-EBSD Study of npAu Catalysts

Direct Real Time Microstructure Evolution Observation of Ti-6Al-4V Alloy by In-Situ EBSD during Cycling Heating and Cooling at Elevated Temperatures using heater in SEM/FIB Systems

Cryo-FIB Lamella Milling: A Comprehensive Technique to Prepare Samples of Both Plunge- and High-pressure Frozen-hydrated Specimens for in situ Studies.

FIB/SEM Processing of Biological Samples

An Improved FIB Sample Preparation Technique for Site-specific Plan-view Specimens: A New Cutting Geometry

Microscopy and Microanalysis

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Volume 24 - August 2018

Analytical and Instrumentation Science Symposia

Solid-state X-ray Spectrometry at 50 Years

Abstract

The FIB-SEM Laboratory: Sample Preparation and Beyond

Abstract