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Using Three-Dimensional Electron Backscatter Diffraction Data to Measure Grain Boundary Properties in Metals and Ceramics

Published online by Cambridge University Press:  01 August 2018

Gregory S. Rohrer
Gregory S. Rohrer*
Affiliation:
Department of Material Science and Engineering, Carnegie Mellon University, Pittsburgh, PA, USA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 810 - 811
Copyright
© Microscopy Society of America 2018 

References

[1] Beladi, H. Rohrer, G.S. Acta Mater. 61 2013 1404.Google Scholar
[2] Beladi, H., Nuhfer, N.T. Rohrer, G.S. Acta Mater. 70 2014) p. 281.Google Scholar
[3] Kelly, M.N., Glowinski, K., Nuhfer, N.T. Rohrer, G.S. Acta Mater. 111 2016 22.Google Scholar
[4] Rohrer, G.S. J. Mater. Sci. 46 2011 5881.Google Scholar
[5] Zhong, X., Rowenhorst, D.J., Beladi, H. Rohrer, G.S. Acta Mater. 123 2017 136.Google Scholar