Hostname: page-component-848d4c4894-cjp7w Total loading time: 0 Render date: 2024-07-01T11:25:29.387Z Has data issue: false hasContentIssue false
  • English
  • Français

Using FIB-SEM as a Platform for the Positioning and Correlated Characterization of III-V Nanowires

Published online by Cambridge University Press:  01 August 2018

Aleksander B. Mosberg ,
Dingding Ren ,
Vidar T. Fauske ,
Bjorn Ove Fimland  and
Antonius T. J. van Helvoort
Aleksander B. Mosberg
Affiliation:
Department of Physics and
Dingding Ren
Affiliation:
Department of Electronic Systems, Norwegian University of Science and Technology (NTNU), Trondheim, Norway
Vidar T. Fauske
Affiliation:
Department of Physics and
Bjorn Ove Fimland
Affiliation:
Department of Electronic Systems, Norwegian University of Science and Technology (NTNU), Trondheim, Norway
Antonius T. J. van Helvoort
Affiliation:
Department of Physics and

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 806 - 807
Copyright
© Microscopy Society of America 2018 

References

[1] Yao, N (ed.) Focused Ion Beamp. Systems: Basics and Applications. C.U. Press Cambridge.Google Scholar
[2] Yan, R, et al, Nature Photonics 3 2009) p. 569–576.Google Scholar
[3] Ren, D, et al, Applied Physics Letters 109 2016) p. 243102.Google Scholar
[4] Mosberg, A B, et al, J. Phys.: Conf. Ser. 902 2017) p. 012020.Google Scholar
[5] Kim, C-S, et al, Vacuum 86 2012) p. 1014–1035.Google Scholar
[6] Fauske, V T, et al, J. Phys.: Conf. Ser. 522 2014) p. 012080.Google Scholar
[7] Munshi, A M, et al, Nano Lett. 12 2012) p. 4570–4576.Google Scholar
[8] NTNU and the Research Council of Norway are acknowledged for financial support via the initiative Enabling technologies: Nanotechnology, as well as to NorFab, (project number 245963/F50), NORTEM (grant 197405) and FRINATEK (grant 214235).Google Scholar