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Crystal Grain Observation Using a Segmented Backscattered Electron Detector

Published online by Cambridge University Press:  01 August 2018

Takeshi Otsuka
Affiliation:
JEOL Ltd., Akishima, Tokyo, Japan
Masaya Hara
Affiliation:
JEOL Ltd., Akishima, Tokyo, Japan
Natasha Erdman
Affiliation:
JEOL USA, Inc., Peabody, MA, USA
Shin-ichi Kitamura
Affiliation:
JEOL Ltd., Akishima, Tokyo, Japan

Abstract

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Type
Abstract
Copyright
© Microscopy Society of America 2018