Microscopy and Microanalysis: Volume 16 - Issue S2

Helium Ion Microscopy for the Characterization of Complex 3D Structures in a C/CrC Nanocomposite
Z Zhou, MAE Jepson, X Liu, WM Rainforth, C Rodenburg
Published online by Cambridge University Press:

01 August 2010, pp. 602-603
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Scanning Transmission Ion Microscopy and Diffraction Imaging
DC Joy, J Notte IV, R Hill, SM McVey, R Ramachandra, BJ Griffin
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01 August 2010, pp. 604-605
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Starting a Revolution: A New Approach to Scanning Beam Microscopy
LG Lechner
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01 August 2010, pp. 606-607
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Future Prospects for SEM-based Defect Analysis using Fast Electrons
YN Picard, RJ Kamaladasa, N Kumar, C Trager-Cowan, W Jiang, M Skowronski, PA Salvador, H Behmemburg, C Giesen, AP Day, G England
Published online by Cambridge University Press:

01 August 2010, pp. 608-609
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Sub-angstrom Spatial Resolution in Secondary-electron Imaging Achieved with an Aberration Corrected Scanning Electron Microscope
H Inada, D Su, M Konno, K Nakamura, RF Egerton, J Wall, Y Zhu
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01 August 2010, pp. 610-611
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Quantitative Analysis by Electron Transmission Measurements in a Scanning Electron Microscope
E Müller, T Volkenandt, DZ Hu, DM Schaadt, D Gerthsen
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01 August 2010, pp. 612-613
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Use of Sample Bias Voltage for Low-Energy High-Resolution Imaging in the SEM
JR Michael, DC Joy, BJ Griffin
Published online by Cambridge University Press:

01 August 2010, pp. 614-615
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

A Study of the Signal Information by ULV-SEM in Ultra Low Landing Voltage
S Takeuchi, A Miyaki, A Muto, S Okada, M Hatano, S Ito
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01 August 2010, pp. 616-617
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Capturing Die Layout of Obsolete ASIC Using Extreme Field of View SEM
J Gazda, A Jachniewicz, C Sallee, R Young
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01 August 2010, pp. 618-619
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Physics of Atomic-Scale Secondary-Electron Imaging
RF Egerton, D Su, J Wall, Y Zhu
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01 August 2010, pp. 620-621
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Advantages of Energy Selective Secondary Electron Detection in SEM
C Rodenburg, MAE Jepson, E Bosch
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01 August 2010, pp. 622-623
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

A Comparison of a Luminescence-based VPSE and an Electron-based GSED for SE and CL Imaging in Variable Pressure SEM with Conventional SE imaging
BJ Griffin, JR Michael, DC Joy
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01 August 2010, pp. 624-625
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Low Voltage Imaging and X-Ray Microanalysis in the FE-SEM
R Gauvin
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01 August 2010, pp. 626-627
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

SEM Imaging of Resist Patterns Fabricated Through Imprint Lithography Techniques
C Schamp, BT Valdez, LK Ballast, A Gill, SA Pierce, L Brown, C Brooks, E Thompson, B Roth
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01 August 2010, pp. 628-629
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Imaging Dynabeads with the Scanning Electron Microscope
JG Ault, K Tuz, B Shi, J Walsh, A Andreas, E Shimakawa, RJ Ferland
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01 August 2010, pp. 630-631
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Surface Sensitive and Compositional SEM Imaging for High Accelerating Voltages in Focused Ion/Electron Beam Systems
T Agemura, T Nomaguchi, T Onishi
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01 August 2010, pp. 632-633
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Microscopy and Chemical Inversing Techniques to Determine the Photonic Crystal Structure of Iridescent Beetle Scales in the Cerambycidae Family
LR Richey, JS Gardner, MD Standing, MR Jorgensen, MH Bartl
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01 August 2010, pp. 634-635
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Application of Microscopy in Pharmaceutical Development from Discovery to Manufacture Process Scale-up
MS Ku, JQ Liang, D Lu
Published online by Cambridge University Press:

01 August 2010, pp. 636-637
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Characterization of Substrate-Active Ingredient Interactions using In Situ Microscopy
GA Camacho-Bragado, FM Dixon
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01 August 2010, pp. 638-639
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Forensic Science in the Pharmaceutical Industry – A Microscopy Perspective
JA Reffner
Published online by Cambridge University Press:

01 August 2010, pp. 640-641
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

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Volume 16 - Supplement S2 - July 2010

Instrumentation and Techniques Symposia

Slow Electrons, Fast Ions: How Well Do We Image and What Do We Image With Scanning Beam Microscopy?

Abstract

Helium Ion Microscopy for the Characterization of Complex 3D Structures in a C/CrC Nanocomposite

Scanning Transmission Ion Microscopy and Diffraction Imaging

Starting a Revolution: A New Approach to Scanning Beam Microscopy

Future Prospects for SEM-based Defect Analysis using Fast Electrons

Sub-angstrom Spatial Resolution in Secondary-electron Imaging Achieved with an Aberration Corrected Scanning Electron Microscope

Quantitative Analysis by Electron Transmission Measurements in a Scanning Electron Microscope

Use of Sample Bias Voltage for Low-Energy High-Resolution Imaging in the SEM

A Study of the Signal Information by ULV-SEM in Ultra Low Landing Voltage

Capturing Die Layout of Obsolete ASIC Using Extreme Field of View SEM

Physics of Atomic-Scale Secondary-Electron Imaging

Advantages of Energy Selective Secondary Electron Detection in SEM

A Comparison of a Luminescence-based VPSE and an Electron-based GSED for SE and CL Imaging in Variable Pressure SEM with Conventional SE imaging

Low Voltage Imaging and X-Ray Microanalysis in the FE-SEM

SEM Imaging of Resist Patterns Fabricated Through Imprint Lithography Techniques

Imaging Dynabeads with the Scanning Electron Microscope

Surface Sensitive and Compositional SEM Imaging for High Accelerating Voltages in Focused Ion/Electron Beam Systems

Microscopy and Chemical Inversing Techniques to Determine the Photonic Crystal Structure of Iridescent Beetle Scales in the Cerambycidae Family

Microscopy, Microanalysis and Image Analysis in the Pharmaceutical Sciences

Abstract

Application of Microscopy in Pharmaceutical Development from Discovery to Manufacture Process Scale-up

Characterization of Substrate-Active Ingredient Interactions using In Situ Microscopy

Forensic Science in the Pharmaceutical Industry – A Microscopy Perspective

Microscopy and Microanalysis

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Volume 16 - Supplement S2 - July 2010

Instrumentation and Techniques Symposia

Slow Electrons, Fast Ions: How Well Do We Image and What Do We Image With Scanning Beam Microscopy?

Abstract

Microscopy, Microanalysis and Image Analysis in the Pharmaceutical Sciences

Abstract