Microscopy and Microanalysis: Volume 16 - Issue S2

Application of Novel Techniques to the Three-dimensional Characterization of Microstructural Features in α+β Titanium Alloys
JM Sosa, S Koduri, V Dixit, PC Collins, S Niezgoda, SR Kalidindi, HL Fraser
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01 August 2010, pp. 722-723
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Polishing Technique to Identify Particles in Polygranular Graphite
RM Paul, JE Morral
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01 August 2010, pp. 724-725
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Characterization of Dynamic Damage of Copper Targets using X-ray Micro Tomography
BM Patterson, EK Cerreta, D Dennis-Koller, CA Bronkhorst, BL Hansen
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01 August 2010, pp. 726-727
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Advanced Spectral Imaging for Microanalysis of Cultural Heritage
FG France, MB Toth, WA Christens-Barry, K Boydston
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01 August 2010, pp. 728-729
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Elastic Alignment of Microscopic Images Using Parallel Processing on CUDA-Supported Graphics Processor Units
J Michálek, M Čapek, J Janáček, L Kubínová
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01 August 2010, pp. 730-731
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Applying the Google Earth™ Paradigm to Microscopical Specimen Mapping
NHM Caldwell, ARM Shoaib, BC Breton, DM Holburn
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01 August 2010, pp. 732-733
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Spatio-Temporal Simulation Environment: A Microscopy Image Based Modelization Framework
S Stoma, E Klipp
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01 August 2010, pp. 734-735
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Measurement of Capillary Length from 3D Images Acquired by Confocal Microscopy Using Image Analysis and Stereology
L Kubínová, J Janáček, I Eržen, XW Mao
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01 August 2010, pp. 736-737
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Automatic Detection of Combed DNA
S Hareli, E Ozeri-Galai, B Kerem, A Weiss
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01 August 2010, pp. 738-739
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

In vivo chemical imaging and quantitation of microalgae using synchrotron-based infrared microspectroscopic imaging
S Ratti, C Olivieri, M Nasse, E Duranty, R Burke, M Giordano, F Vogt, CJ Hirschmugl
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01 August 2010, pp. 740-741
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Direct Comparison of Convergent Beam Electron Diffraction and Geometric Phase Analysis for Local Strain Measurement
D Diercks, G Lian, J Chung, M Kaufman
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01 August 2010, pp. 742-743
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Orientation Imaging Microscopy of Nanocrystalline Platinum Thin Film Using Transmission Electron Microscope
V Kumar
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01 August 2010, pp. 744-745
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

STEM Stacking Fault Analysis in Ni-based Super Alloys
PJ Phillips, M De Graef, MJ Mills
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01 August 2010, pp. 746-747
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Quantitative Phase Retrieval by Ptychography in TEM
F Hüe, AM Maiden, JM Rodenburg, PA Midgley
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01 August 2010, pp. 748-749
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Applications of Quantitative Microscopy in the Plastics Industry
O Guise, C Strom
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01 August 2010, pp. 750-751
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Effect of Tip-sample Angle on Atomic Force Microscopy Images
F Wang, F Zhou
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01 August 2010, pp. 752-753
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Advanced Simulation of Polycrystalline Electron Diffraction Patterns
XZ Li
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01 August 2010, pp. 754-755
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Automation of Angular Reconstitution for Facilitating the Construction of Initial Models in Single-Particle Electron Microscopy
D Lyumkis, S Nayak, RR Milligan, CS Potter, B Carragher
Published online by Cambridge University Press:

01 August 2010, pp. 756-757
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Lateral Brightness Correction in Confocal Microscopy Images Using Mathematical Morphology Filters
J Michálek, M Čapek, XW Mao, L Kubínová
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01 August 2010, pp. 758-759
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Development of a Segmented Detector for Aberration Corrected Scanning Transmission Electron Microscopes
Y Kohno, N Shibata, H Sawada, SD Findlay, Y Kondo, Y Ikuhara
Published online by Cambridge University Press:

01 August 2010, pp. 760-761
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

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Volume 16 - Supplement S2 - July 2010

Instrumentation and Techniques Symposia

Image Analysis & Quantitative Microscopy

Abstract

Application of Novel Techniques to the Three-dimensional Characterization of Microstructural Features in α+β Titanium Alloys

Polishing Technique to Identify Particles in Polygranular Graphite

Characterization of Dynamic Damage of Copper Targets using X-ray Micro Tomography

Advanced Spectral Imaging for Microanalysis of Cultural Heritage

Elastic Alignment of Microscopic Images Using Parallel Processing on CUDA-Supported Graphics Processor Units

Applying the Google Earth™ Paradigm to Microscopical Specimen Mapping

Spatio-Temporal Simulation Environment: A Microscopy Image Based Modelization Framework

Measurement of Capillary Length from 3D Images Acquired by Confocal Microscopy Using Image Analysis and Stereology

Automatic Detection of Combed DNA

In vivo chemical imaging and quantitation of microalgae using synchrotron-based infrared microspectroscopic imaging

Direct Comparison of Convergent Beam Electron Diffraction and Geometric Phase Analysis for Local Strain Measurement

Orientation Imaging Microscopy of Nanocrystalline Platinum Thin Film Using Transmission Electron Microscope

STEM Stacking Fault Analysis in Ni-based Super Alloys

Quantitative Phase Retrieval by Ptychography in TEM

Applications of Quantitative Microscopy in the Plastics Industry

Effect of Tip-sample Angle on Atomic Force Microscopy Images

Advanced Simulation of Polycrystalline Electron Diffraction Patterns

Automation of Angular Reconstitution for Facilitating the Construction of Initial Models in Single-Particle Electron Microscopy

Lateral Brightness Correction in Confocal Microscopy Images Using Mathematical Morphology Filters

Development of a Segmented Detector for Aberration Corrected Scanning Transmission Electron Microscopes

Microscopy and Microanalysis

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Volume 16 - Supplement S2 - July 2010

Instrumentation and Techniques Symposia

Image Analysis & Quantitative Microscopy

Abstract