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Direct Comparison of Convergent Beam Electron Diffraction and Geometric Phase Analysis for Local Strain Measurement

Published online by Cambridge University Press:  01 August 2010

D Diercks ,
G Lian ,
J Chung  and
M Kaufman
D Diercks
Affiliation:
University of North Texas
G Lian
Affiliation:
Texas Instruments
J Chung
Affiliation:
Texas Instruments
M Kaufman
Affiliation:
Colorado School of Mines

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 742 - 743
Copyright
Copyright © Microscopy Society of America 2010