Microscopy and Microanalysis: Volume 27 - Issue S1

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 27 - Supplement S1 - August 2021

Physical Sciences Symposia

Nanoscale x-ray and Electron Microscopy Techniques and Applications in Material Science

Characterizing the Back-Contact Interface of Poly-Crystalline Cd(Se)Te Devices with XEDS, EELS, and HRSTEM

Optimized Amplitude-Dividing Beam Splitter Gratings for 4D STEM Holography

Analytical Sciences Symposia

Diffraction Imaging Across Disciplines

Symmetry Analysis in Metallic Glasses by Electron Nanodiffraction

Multislice electron ptychography enables lattice vibration-limited resolution and linear phase-contrast imaging in thick samples

Dose-efficient tcBF-STEM imaging with real-space information beyond the scan sampling limit

Strategies for fast and reliable 4D-STEM orientation and phase mapping of nanomaterials and devices

Unifying 3D electron diffraction and serial electron diffraction into a high-resolution, high-accuracy and high-throughput structural analysis technique

Advances in Focused Ion Beam Instrumentation, Applications and Techniques in and Materials and Life Sciences

Imaging and Ion-Beam Milling of Biological Specimens with the Helium-Ion Microscope

New Imaging modality for surface and sub-surface imaging using Scanning Transmission Helium Ion Microscopy

Characterization of selective layer and biomolecules fouling in polymeric membranes for microalgae filtration applications using 3D FIB/SEM

Forward modeling of volume electron microscopy (vEM) of stained resin-embedded biological samples

Comparison of segmentation algorithms for FIB/SEM tomography of porous polymers: Importance of image contrast for machine learning segmentation

Microscopy and Microanalysis for Real World Problem Solving

How Many Microscopies Does It Take to Get to the Root Cause of the Fail? Sample Prep, Imaging, and In-Situ Analysis for Integrated Circuit Failure Analysis at the 14nm Node

Highly Accurate and Portable 3D Surface Analysis Tool (APSA) for Printed Circuit Boards (PCB) Reconstruction and Assurance

Strain measurements in industrial applications: A case study of solder bumps in semiconductor devices

The novel feature based inspection technique that can detect defects that can affect the deterioration of the electrical properties of semiconductor devices

Advanced quality control scanning system for electronic materials

New Frontiers in In-Situ Electron Microscopy in Liquids and Gases (L&G EM FIG Sponsored)

Practical Aspects of Performing Quantitive EELS Measurements of Gas Compositions in Closed-Cell Gas Reaction S/TEM

Electron energy-loss spectroscopy for direct visualization of gas adsorption sites

Resolution Models for Energy-Filtered TEM Imaging over Thick Liquid or Amorphous Layers

Microscopy and Microanalysis

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Volume 27 - Supplement S1 - August 2021

Physical Sciences Symposia

Nanoscale x-ray and Electron Microscopy Techniques and Applications in Material Science

Analytical Sciences Symposia

Diffraction Imaging Across Disciplines

Advances in Focused Ion Beam Instrumentation, Applications and Techniques in and Materials and Life Sciences

Microscopy and Microanalysis for Real World Problem Solving

New Frontiers in In-Situ Electron Microscopy in Liquids and Gases (L&G EM FIG Sponsored)