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Comparison of segmentation algorithms for FIB/SEM tomography of porous polymers: Importance of image contrast for machine learning segmentation

Published online by Cambridge University Press:  30 July 2021

Martin Čalkovský
Affiliation:
Laboratory for Electron Microscopy, Karlruhe Institute of Technology, United States
Erich Müller
Affiliation:
Karlsruhe Institute of Technology (KIT), Laboratory for Electron Microscopy (LEM), Engesserstraße 7, 76131 Karlsruhe, Germany, United States
Matthias Meffert
Affiliation:
Laboratory for Electron Microscopy, Karlsruhe Institute of Technology (KIT), Engesserst. 7, 76131 Karlsruhe, Germany, United States
Nadejda Firman
Affiliation:
Laboratory for Electron Microscopy, Karlsruhe Institute of Technology (KIT), Engesserst. 7, 76131 Karlsruhe, Germany, United States
Frederik Mayer
Affiliation:
Institute of Applied Physics, Karlsruhe Institute of Technology (KIT), Wolfgang-Gaede-Straße 1, 76131 Karlsruhe, Germany, United States
Martin Wegener
Affiliation:
Institute of Applied Physics, Karlsruhe Institute of Technology (KIT), Wolfgang-Gaede-Straße 1, 76131 Karlsruhe, Germany, United States
Dagmar Gerthsen
Affiliation:
Laboratorium für Elektronenmikroskopie, Karlsruher Institut für Technologie (KIT), Engesserstr. 7, 76131 Karlsruhe, Germany, United States

Abstract

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Type
Advances in Focused Ion Beam Instrumentation, Applications and Techniques in and Materials and Life Sciences
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

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We acknowledge funding by the Deutsche Forschungsgemeinschaft (DFG, German Research Foundation) under Germany's Excellence Strategy–2082/1–390761711.Google Scholar