Hostname: page-component-76fb5796d-zzh7m Total loading time: 0 Render date: 2024-04-26T16:25:04.545Z Has data issue: false hasContentIssue false
  • English
  • Français

Symmetry Analysis in Metallic Glasses by Electron Nanodiffraction

Published online by Cambridge University Press:  30 July 2021

Shuoyuan Huang ,
Carter Francis  and
Paul Voyles
Shuoyuan Huang
Affiliation:
University of Wisconsin Madison, United States
Carter Francis
Affiliation:
University of Wisconsin Madison, United States
Paul Voyles
Affiliation:
University of Wisconsin Madison, United States

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Diffraction Imaging Across Disciplines
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 748 - 752
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Liu, A.C.Y., Neish, M.J., Stokol, G., Buckley, G.A., Smillie, L.A., De Jonge, M.D., Ott, R.T., Kramer, M.J., Bourgeois, L., Systematic mapping of icosahedral short-range order in a melt-spun Zr36Cu64 metallic glass, Phys. Rev. Lett. 110 (2013) 1–5.https://doi.org/10.1103/PhysRevLett. 110.205505.Google Scholar
Im, S., Chen, Z., Johnson, J.M., Zhao, P., Yoo, G.H., Park, E.S., Wang, Y., Muller, D.A., Hwang, J., Direct determination of structural heterogeneity in metallic glasses using four-dimensional scanning transmission electron microscopy, Ultramicroscopy. 195 (2018) 189–193. https://doi.org/10.1016/j.ultramic.2018.09.005.CrossRefGoogle ScholarPubMed
Krajnak, M., Etheridge, J., A symmetry-derived mechanism for atomic resolution imaging, Proc. Natl. Acad. Sci. U. S. A. 117 (2020) 27805 27810. https://doi.org/10.1073/pnas.2006975117.CrossRefGoogle ScholarPubMed
Rodenburg, J.M., Properties of electron microdiffraction patterns from amorphous materials, Ultramicroscopy. 25 (1988) 329–343. https://doi.org/https://doi.org/10.1016/0304-3991(88)90007-1.Google Scholar