Hostname: page-component-84b7d79bbc-7nlkj Total loading time: 0 Render date: 2024-07-25T20:59:05.971Z Has data issue: false hasContentIssue false
  • English
  • Français

Dose-efficient tcBF-STEM imaging with real-space information beyond the scan sampling limit

Published online by Cambridge University Press:  30 July 2021

Yue Yu ,
Katherine Spoth ,
David Muller  and
Lena Kourkoutis
Yue Yu
Affiliation:
School of Applied and Engineering Physics, Cornell University, United States
Katherine Spoth
Affiliation:
Cornell Center for Materials Research, Cornell University, United States
David Muller
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA, Ithaca, New York, United States
Lena Kourkoutis
Affiliation:
School of Applied and Engineering Physics, Cornell University, United States

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Diffraction Imaging Across Disciplines
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 758 - 760
Check for updates
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Spoth, K. A., et al. , Microscopy and Microanalysis 23 (2017), p. 804-805.CrossRefGoogle Scholar
Tate, M. W., et al. , Microscopy and Microanalysis 22 (2016), p. 237-249.CrossRefGoogle Scholar
Lupini, A. R., et al. , Journal of Microscopy 263 (2016), p. 43-50.CrossRefGoogle Scholar
Saxton, W. O. and Baumeister, W., Journal of Microscopy 127 (1982), p. 127–138.CrossRefGoogle Scholar