19 results
50pm Aberration Corrected In-situ Electron Microscopy - How Ion behaves in Lithium Ion Nanowire Battery
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1133-1134
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- August 2015
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Determination of Aberration Center of STEM Ronchigram for Fully Automated Aberration Correctors
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 308-309
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- August 2013
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In-situ ABF-STEM Observation of Structure Transformation of Spinel LiV2O4 Crystals
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 368-369
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- July 2012
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Observation of Defects of CuInSe2 by 300 kV Aberration Corrected Scanning Transmission Electron Microscope
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 1268-1269
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- July 2011
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Quantitative Annular Dark Field Images of Silicon (001) Crystal
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 1294-1295
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- July 2011
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Counting the Number of Lithium Atoms in the Diffusion Channel by Annular Bright Field imaging
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 1580-1581
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- July 2011
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Visualization of Lithium Atoms in LiV2O4 by a Spherical Aberration Corrected Electron Microscope
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 162-163
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- July 2010
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Visualization of Anitimony (Sb) Dopant Clusters in Silicon Specimen by Large Angle Convergent Beam HAADF-STEM
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 1732-1733
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- July 2010
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Highly Stable 300kV Cold Field Emission Gun for 50pm Resolution Electron Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 1084-1085
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- July 2009
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Detection of Arsenic Dopant Atoms in Silicon Crystal by Aberration Corrected Scanning Transmission Electron Microscope
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 1488-1489
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- July 2009
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Adatom on Graphene, Directly Imaged by Aberration Corrected TEM at 300kV
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 1476-1477
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- July 2009
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Electron Energy Loss Spectroscopy of Graphene Identified by Aberration, Corrected TEM at 300kV
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 1484-1485
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- July 2009
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In-Situ Observation of Au/TiO2 Catalyst in Oxygen-Gas Environments
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 692-693
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- July 2009
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Auto-Adjustment of Aberration Correction and Experimental Evaluation of R005 Microscope
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 802-803
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- August 2008
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Development of Spherical Aberration Corrected 300kV FETEM
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- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 880-881
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- August 2007
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In-situ UHV-Electron Microscopy with Scanning Tunneling Microscope
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- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
- Published online by Cambridge University Press:
- 01 August 2002, pp. 414-415
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- August 2002
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REM Studies of Surface Dynamics on Si Surfaces
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- Microscopy and Microanalysis / Volume 3 / Issue S2 / August 1997
- Published online by Cambridge University Press:
- 02 July 2020, pp. 579-580
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- August 1997
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Structure of the in on SI(111)4X1 Surface Determined by Applying Direct Phasing Methods to Transmission Electron Diffraction Data
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- Microscopy and Microanalysis / Volume 3 / Issue S2 / August 1997
- Published online by Cambridge University Press:
- 02 July 2020, pp. 1041-1042
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- August 1997
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High Resolution UHV Electron Microscopy on Surfaces and Heteroepitaxy
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- MRS Online Proceedings Library Archive / Volume 139 / 1989
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- 21 February 2011, 59
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- 1989
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