Hostname: page-component-848d4c4894-nmvwc Total loading time: 0 Render date: 2024-07-02T12:51:29.945Z Has data issue: false hasContentIssue false
  • English
  • Français

Adatom on Graphene, Directly Imaged by Aberration Corrected TEM at 300kV

Published online by Cambridge University Press:  26 July 2009

T Tanaka ,
Y Abe ,
H Sawada ,
H Okunishi ,
Y Kondo ,
Y Tanishiro  and
K Takayanagi
T Tanaka
Affiliation:
Tokyo Institute of Technology,Japan
Y Abe
Affiliation:
Tokyo Institute of Technology,Japan
H Sawada
Affiliation:
JEOL Ltd ,Japan
H Okunishi
Affiliation:
JEOL Ltd ,Japan
Y Kondo
Affiliation:
JEOL Ltd ,Japan
Y Tanishiro
Affiliation:
Tokyo Institute of Technology,Japan
K Takayanagi
Affiliation:
Tokyo Institute of Technology,Japan

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type
Abstract
Information
Microscopy and Microanalysis , Volume 15 , Supplement S2 , July 2009 , pp. 1476 - 1477
Copyright
Copyright © Microscopy Society of America 2009