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Observation of Defects of CuInSe2 by 300 kV Aberration Corrected Scanning Transmission Electron Microscope

Published online by Cambridge University Press:  08 April 2017

T Tanaka ,
A Takeshita ,
T Kubota ,
Y Oshima ,
Y Tanishiro  and
K Takayanagi
T Tanaka
Affiliation:
Tokyo Institute of Technology, Japan
A Takeshita
Affiliation:
Tokyo Institute of Technology, Japan
T Kubota
Affiliation:
Honda R&D Co, Ltd
Y Oshima
Affiliation:
Research Center for Ultra HVEM
Y Tanishiro
Affiliation:
Tokyo Institute of Technology, Japan
K Takayanagi
Affiliation:
Tokyo Institute of Technology, Japan

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 1268 - 1269
Copyright
Copyright © Microscopy Society of America 2011