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50pm Aberration Corrected In-situ Electron Microscopy - How Ion behaves in Lithium Ion Nanowire Battery

Published online by Cambridge University Press:  23 September 2015

K. Takayanagi ,
S. Lee ,
Y. Oshima  and
Y. Tanishiro
K. Takayanagi
Affiliation:
Physics Department, Tokyo Institute of Technology, Tokyo, Japan. CREST-JST, Tokyo, Japan.
S. Lee
Affiliation:
Quantum Nanoelectronics Research Center, Tokyo Institute of Technology, Tokyo, Japan. CREST-JST, Tokyo, Japan.
Y. Oshima
Affiliation:
School of Materials Science, JAIST, Ishikawa, Japan. CREST-JST, Tokyo, Japan.
Y. Tanishiro
Affiliation:
Quantum Nanoelectronics Research Center, Tokyo Institute of Technology, Tokyo, Japan. CREST-JST, Tokyo, Japan.

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1133 - 1134
Copyright
Copyright © Microscopy Society of America 2015 

References

References:

[1] Thackeray, M. M., et al, Mater. Res. Bull. 18 (1983). p 461.CrossRefGoogle Scholar
[2] Vetter, J., et al, J. Power Sources 147 (2005). p 269.Google Scholar
[3] Lee, S., et al, J. Phys. Chem C117 (2013). p 24236.Google Scholar
[4] Lee, S., et al, DOI: 10.1021/nn505952k 2014.Google Scholar
[5] Sawada, H., et al, J. Electron. Microsc. 58 (2009). p 357.CrossRefGoogle Scholar
[6] Lee, S., et al, J. Appl. Phys. 109 (2011). p 113530.Google Scholar
[7] Lee, S., et al, Jpn. J. Appl. Phys. 51 (2012). p 020202.Google Scholar