17 results
Contributors
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- Book:
- Neuroimaging of Sleep and Sleep Disorders
- Published online:
- 05 March 2013
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- 07 March 2013, pp viii-xii
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Epitaxial growth of C60 thin films on mica
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- Journal:
- Journal of Materials Research / Volume 7 / Issue 4 / April 1992
- Published online by Cambridge University Press:
- 31 January 2011, pp. 784-787
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- April 1992
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Hydrogen Segregation To Interfaces
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- Journal:
- MRS Online Proceedings Library Archive / Volume 238 / 1991
- Published online by Cambridge University Press:
- 25 February 2011, 413
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- 1991
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Possible evidence for overcoordination at semiconductor grain boundaries
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- Journal:
- Journal of Materials Research / Volume 5 / Issue 3 / March 1990
- Published online by Cambridge University Press:
- 31 January 2011, pp. 587-592
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- March 1990
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On the Indium Precipitation in Silicon
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- Journal:
- MRS Online Proceedings Library Archive / Volume 139 / 1989
- Published online by Cambridge University Press:
- 21 February 2011, 135
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- 1989
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Structure Determination of the Si(111)-CaF2 Interface
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- Journal:
- MRS Online Proceedings Library Archive / Volume 139 / 1989
- Published online by Cambridge University Press:
- 21 February 2011, 141
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- 1989
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Analysis of Oxide Surfaces by High Resolution Transmission Electron Microscopy
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- Journal:
- MRS Online Proceedings Library Archive / Volume 83 / 1986
- Published online by Cambridge University Press:
- 25 February 2011, 219
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- 1986
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Grain Boundary Dislocations in GaAs
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- Journal:
- MRS Online Proceedings Library Archive / Volume 82 / 1986
- Published online by Cambridge University Press:
- 26 February 2011, 349
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- 1986
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Structural Observations of Porous Silica Gels
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- Journal:
- MRS Online Proceedings Library Archive / Volume 73 / 1986
- Published online by Cambridge University Press:
- 28 February 2011, 331
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- 1986
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Diffusion, Migration and the Atomic Structure of some Grain Boundaries
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- Journal:
- MRS Online Proceedings Library Archive / Volume 57 / 1985
- Published online by Cambridge University Press:
- 26 February 2011, 357
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- 1985
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Atomic Structure of the Epitaxial Al/Si Interface
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- Journal:
- MRS Online Proceedings Library Archive / Volume 37 / 1984
- Published online by Cambridge University Press:
- 26 February 2011, 395
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- 1984
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Characterization of Tilt Boundaries by Ultra High Resolution Electron Microscopy
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- Journal:
- MRS Online Proceedings Library Archive / Volume 41 / 1984
- Published online by Cambridge University Press:
- 25 February 2011, 253
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- 1984
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Symposium N
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- Journal:
- MRS Bulletin / Volume 8 / Issue 6 / December 1983
- Published online by Cambridge University Press:
- 18 October 2013, p. 27
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- December 1983
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Analysis of High Resolution Electron Microscope Images of the Pd2Si-Si Interface
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- Journal:
- MRS Online Proceedings Library Archive / Volume 10 / 1981
- Published online by Cambridge University Press:
- 15 February 2011, 111
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- 1981
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Undissociated Dislocations and Intermediate Defects in as+ Ion Damaged Silicon
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- Journal:
- MRS Online Proceedings Library Archive / Volume 2 / 1980
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- 15 February 2011, 173
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- 1980
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Detection of Point Defect Chains in Ion Irradiated Silicon by High Resolution Electron Microscopy
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- Journal:
- MRS Online Proceedings Library Archive / Volume 2 / 1980
- Published online by Cambridge University Press:
- 15 February 2011, 185
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- 1980
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A Tentative Identification of the Nature of {113} Stacking Faults in Si – Model and Experiment
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- Journal:
- MRS Online Proceedings Library Archive / Volume 2 / 1980
- Published online by Cambridge University Press:
- 15 February 2011, 179
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- 1980
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